Lutkenhaus Jeffrey, Lowell David, George David, Zhang Hualiang, Lin Yuankun
Department of Physics, University of North Texas, Denton, TX 76203, USA.
ECE Department, University of Massachusetts Lowell, Lowell, MA 01854, USA.
Micromachines (Basel). 2016 Apr 1;7(4):59. doi: 10.3390/mi7040059.
We report the holographic fabrication of designed defect lines in photonic crystal lattices through phase engineering using a spatial light modulator (SLM). The diffracted beams from the SLM not only carry the defect's content but also the defect related phase-shifting information. The phase-shifting induced lattice shifting in photonic lattices around the defects in three-beam interference is less than the one produced by five-beam interference due to the alternating shifting in lattice in three beam interference. By designing the defect line at a 45 degree orientation and using three-beam interference, the defect orientation can be aligned with the background photonic lattice, and the shifting is only in one side of the defect line, in agreement with the theory. Finally, a new design for the integration of functional defect lines in a background phase pattern reduces the relative phase shift of the defect and utilizes the different diffraction efficiency between the defect line and background phase pattern. We demonstrate that the desired and functional defect lattice can be registered into the background lattice through the direct imaging of designed phase patterns.
我们报道了使用空间光调制器(SLM)通过相位工程在光子晶格中全息制造设计缺陷线的方法。来自SLM的衍射光束不仅携带缺陷的内容,还携带与缺陷相关的相移信息。由于三光束干涉中晶格的交替移动,三光束干涉中光子晶格中围绕缺陷的相移引起的晶格移动小于五光束干涉产生的晶格移动。通过将缺陷线设计为45度取向并使用三光束干涉,缺陷取向可以与背景光子晶格对齐,并且移动仅在缺陷线的一侧,这与理论一致。最后,一种在背景相位图案中集成功能缺陷线的新设计降低了缺陷的相对相移,并利用了缺陷线与背景相位图案之间不同的衍射效率。我们证明,通过对设计相位图案的直接成像,可以将所需的功能缺陷晶格记录到背景晶格中。