Department of Plant, Soil and Microbial Sciences, Michigan State University, 1066 Bogue St., East Lansing, MI, 48824-1325, USA.
Department of Plant Biology, Michigan State University, East Lansing, MI, 48824, USA.
Theor Appl Genet. 2019 Feb;132(2):501-513. doi: 10.1007/s00122-018-3237-9. Epub 2018 Nov 16.
Different loci associated with root resistance to F. virguliforme colonization and foliar resistance to phytotoxin damage in soybean. Use of resistant cultivars is the most efficacious approach to manage soybean sudden death syndrome (SDS), caused by Fusarium virguliforme. The objectives of this study were to (1) map the loci associated with root and foliar resistance to F. virguliforme infection and (2) decipher the relationships between root infection, foliar damage, and plot yield. A mapping population consisting of 153 F-derived recombinant inbred lines from the cross U01-390489 × E07080 was genotyped by SoySNP6 K BeadChip assay. Both foliar damage and F. virguliforme colonization in roots were investigated in the field, and a weak positive correlation was identified between them. Foliar damage had a stronger negative correlation with plot yield than F. virguliforme colonization. Twelve loci associated with foliar damage were identified, and four of them were associated with multiple traits across environments. In contrast, only one locus associated with root resistance to F. virguliforme colonization was identified and mapped on Chromosome 18. It colocalized with the locus associated with foliar damage in the same environment. The locus on Chromosome 6, qSDS6-2, and the locus on Chromosome 18, qSDS18-1, were associated with resistance to SDS phytotoxins and resistance to F. virguliforme colonization of roots, respectively. Both loci affected plot yield. Foliar damage-related traits, especially disease index, are valuable indicators for SDS resistance breeding because of consistency of the identified loci and their stronger correlation with plot yield. The information provided by this study will facilitate marker-assisted selection to improve SDS resistance in soybean.
不同基因座与大豆根抗尖孢镰刀菌侵染和叶抗毒素损伤有关。利用抗性品种是防治由尖孢镰刀菌引起的大豆猝死综合征(SDS)最有效的方法。本研究的目的是:(1)定位与根和叶对尖孢镰刀菌感染的抗性相关的基因座;(2)解析根侵染、叶损伤和小区产量之间的关系。利用 U01-390489 × E07080 杂交产生的 153 个 F1 衍生重组自交系群体,通过 SoySNP6 K BeadChip 分析进行基因型鉴定。在田间调查了叶片损伤和根中尖孢镰刀菌的定殖情况,发现两者之间存在弱正相关。叶片损伤与小区产量的相关性强于尖孢镰刀菌的定殖。鉴定出与叶片损伤相关的 12 个基因座,其中 4 个与多个环境下的多个性状相关。相比之下,仅鉴定出与根抗尖孢镰刀菌侵染相关的 1 个基因座,并将其定位在 18 号染色体上。它与同一环境中与叶片损伤相关的基因座共定位。位于 6 号染色体上的 qSDS6-2 基因座和位于 18 号染色体上的 qSDS18-1 基因座分别与 SDS 毒素抗性和根抗尖孢镰刀菌侵染有关。这两个基因座都影响小区产量。与叶片损伤相关的性状,特别是病情指数,是 SDS 抗性育种的有价值的指标,因为所鉴定的基因座一致,且与小区产量的相关性更强。本研究提供的信息将有助于标记辅助选择,以提高大豆对 SDS 的抗性。