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通过可打印、溶液处理的氨硼烷的等离子体增强化学膜转化(PECFC)直接、无转移生长大面积六方氮化硼薄膜。

Direct, Transfer-Free Growth of Large-Area Hexagonal Boron Nitride Films by Plasma-Enhanced Chemical Film Conversion (PECFC) of Printable, Solution-Processed Ammonia Borane.

机构信息

Department of Materials Science and Engineering, Frederick Seitz Materials Research Laboratory , University of Illinois at Urbana-Champaign , Urbana , Illinois 61801 , United States.

出版信息

ACS Appl Mater Interfaces. 2018 Dec 19;10(50):43936-43945. doi: 10.1021/acsami.8b17152. Epub 2018 Dec 4.

DOI:10.1021/acsami.8b17152
PMID:30462491
Abstract

Synthesis of large-area hexagonal boron nitride (h-BN) films for two-dimensional (2D) electronic applications typically requires high temperatures (∼1000 °C) and catalytic metal substrates which necessitate transfer. Here, analogous to plasma-enhanced chemical vapor deposition, a nonthermal plasma is employed to create energetic and chemically reactive states such as atomic hydrogen and convert a molecular precursor film to h-BN at temperatures as low as 500 °C directly on metal-free substrates-a process we term plasma-enhanced chemical film conversion (PECFC). Films containing ammonia borane as a precursor are prepared by a variety of solution processing methods including spray deposition, spin coating, and inkjet printing and reacted in a cold-wall reactor with a planar dielectric barrier discharge operated at atmospheric pressure in a background of argon or a mixture of argon and hydrogen. Systematic characterization of the converted h-BN films by micro-Raman spectroscopy shows that the minimum temperature for nucleation on silicon-based substrates can be decreased from 800 to 500 °C by the addition of a plasma. Furthermore, the crystalline domain size, as reflected by the full width at half-maximum, increased by more than 3 times. To demonstrate the potential of the h-BN films as a gate dielectric in 2D electronic devices, molybdenum disulfide field effect transistors were fabricated, and the field effect mobility was found to be improved by up to 4 times over silicon dioxide. Overall, PECFC allows h-BN films to be grown at lower temperatures and with improved crystallinity than CVD, directly on substrates suitable for electronic device fabrication.

摘要

用于二维(2D)电子应用的大面积六方氮化硼(h-BN)薄膜的合成通常需要高温(约 1000°C)和催化金属衬底,这需要进行转移。在这里,类似于等离子体增强化学气相沉积,使用非热等离子体来创建高能和化学反应状态,如原子氢,并将分子前体薄膜在低至 500°C 的温度下直接在无金属衬底上转化为 h-BN-我们称之为等离子体增强化学膜转化(PECFC)的过程。通过各种溶液处理方法制备含有氨硼烷作为前体的薄膜,包括喷涂沉积、旋涂和喷墨打印,并在冷壁反应器中在大气压下用平面介电阻挡放电进行反应,该放电在氩气或氩气和氢气的混合物的背景中运行。通过微拉曼光谱对转化后的 h-BN 薄膜进行的系统表征表明,通过添加等离子体,可以将基于硅的衬底上的成核最低温度从 800°C 降低到 500°C。此外,结晶域尺寸(由半峰全宽反映)增加了 3 倍以上。为了展示 h-BN 薄膜作为 2D 电子器件栅介质的潜力,制备了二硫化钼场效应晶体管,并发现其场效应迁移率比二氧化硅提高了高达 4 倍。总体而言,PECFC 允许 h-BN 薄膜在比 CVD 更低的温度和更高的结晶度下生长,直接在适合电子器件制造的衬底上生长。

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