Max Planck Institute for the Science of Light, Staudtstr. 2, D-91058 Erlangen, Germany and Institute of Optics, Information and Photonics, Department of Physics, Friedrich-Alexander-University Erlangen-Nuremberg, Staudtstr. 7/B2, D-91058 Erlangen, Germany.
Phys Rev Lett. 2018 Nov 9;121(19):193902. doi: 10.1103/PhysRevLett.121.193902.
Angstrom precision localization of a single nanoantenna is a crucial step towards advanced nanometrology, medicine, and biophysics. Here, we show that single nanoantenna displacements down to few angstroms can be resolved with sub-angstrom precision using an all-optical method. We utilize the tranverse Kerker scattering scheme where a carefully structured light beam excites a combination of multipolar modes inside a dielectric nanoantenna, which then, upon interference, scatters directionally into the far field. We spectrally tune our scheme such that it is most sensitive to the change in directional scattering per nanoantenna displacement. Finally, we experimentally show that antenna displacement down to 3 Å is resolvable with a localization precision of 0.6 Å.
单纳米天线的埃精度定位是迈向先进纳米计量学、医学和生物物理学的关键步骤。在这里，我们展示了一种利用全光方法可以以亚埃精度分辨低至几个埃的单纳米天线位移。我们利用横向 Kerker 散射方案，其中一束精心设计的光束激发介电纳米天线内的多极模式组合，然后通过干涉，定向散射到远场。我们对我们的方案进行光谱调谐，使其对每个纳米天线位移的定向散射变化最敏感。最后，我们通过实验表明，可分辨出 3 Å 的天线位移，定位精度为 0.6 Å。
