Enhancement of phase retrieval capability in ptychography by using strongly scattering property of the probe-generating device.

In common ptychographic coherent diffractive imaging (PCDI) systems, the probe-generating devices typically exhibit strong scattering, which is not fully used. Here, we report the reasonableness of using the diffraction pattern of the probe-generating device as the frequency-domain information of the scanning probe located in the sample plane, and we propose a method introducing this frequency-domain information into an iterative process to improve the imaging quality of PCDI. The new method was demonstrated using both a visible laser source and a synchrotron radiation X-ray source; the proposed method significantly improved the imaging quality in both demonstrations.