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原子力显微镜红外光谱法探测植物表皮蜡的纳米结构组织。

Nanoscale Structural Organization of Plant Epicuticular Wax Probed by Atomic Force Microscope Infrared Spectroscopy.

出版信息

Anal Chem. 2019 Feb 5;91(3):2472-2479. doi: 10.1021/acs.analchem.8b05294. Epub 2019 Jan 23.

Abstract

The cuticle covers external surfaces of plants, protecting them from biotic and abiotic stress factors. Epicuticular wax on the outer surface of the cuticle modifies reflectance and water loss from plant surfaces and has direct and indirect effects on photosynthesis. Variation in epicuticular wax accumulation, composition, and nanoscale structural organization impacts its biological function. Atomic force microscope infrared spectroscopy (AFM-IR) was utilized to investigate the internal and external surfaces of the cuticle of Sorghum bicolor, an important drought-tolerant cereal, forage, and high-biomass crop. AFM-IR revealed striking heterogeneity in chemical composition within and between the surfaces of the cuticle. The wax aggregate crystallinity and distribution of chemical functional groups across the surfaces was also probed and compared. These results, along with the noninvasive nondestructive nature of the method, suggest that AFM-IR can be used to investigate mechanisms of wax deposition and transport of charged molecules through the plant cuticle.

摘要

表皮覆盖在植物的外表面,保护它们免受生物和非生物胁迫因素的影响。表皮上的角质层蜡质改变了植物表面的反射率和水分流失,对光合作用有直接和间接的影响。角质层蜡质积累、组成和纳米级结构组织的变化会影响其生物功能。原子力显微镜红外光谱(AFM-IR)被用于研究高粱(一种重要的耐旱谷物、饲料和高生物量作物)表皮的内外表面。AFM-IR 揭示了在表皮的表面内和表面之间存在明显的化学成分异质性。还探测和比较了蜡质聚集体结晶度以及化学官能团在表面上的分布。这些结果以及该方法的非侵入性和非破坏性性质表明,AFM-IR 可用于研究蜡质沉积和带电荷分子通过植物表皮运输的机制。

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