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使用随机源的 X 射线散射的多元分析。

Multivariate analysis of x-ray scattering using a stochastic source.

出版信息

Opt Lett. 2019 Jan 15;44(2):243-246. doi: 10.1364/OL.44.000243.

Abstract

The normalization of scattered intensity by incident flux is a crucial step in analyzing data from stochastic x-ray free electron laser sources and is complicated by non-linearities traditionally attributed to detector saturation. Here we show that such non-linearities can also arise when the sample spectra are non-uniform within the monochromator bandwidth. A method for modeling and removing this non-linearity using multivariate regression with shot-by-shot x-ray photon energy as an independent variable is presented. This approach demonstrates the benefit of event building and will allow for a reconsideration of data which has proven challenging to normalize.

摘要

通过入射通量对散射强度进行归一化是分析随机 X 射线自由电子激光源数据的关键步骤,但这一过程受到传统上归因于探测器饱和的非线性的影响。在这里,我们表明,当单色仪带宽内的样品光谱不均匀时,也会出现这种非线性。本文提出了一种使用多元回归和逐点 X 射线光子能量作为独立变量来建模和消除这种非线性的方法。这种方法展示了事件构建的优势,并且可以重新考虑那些难以归一化的数据。

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