Kastengren Alan
Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439, USA.
J Synchrotron Radiat. 2019 Jan 1;26(Pt 1):205-214. doi: 10.1107/S1600577518015230.
Indirect detection of X-rays using single-crystal scintillators is a common approach for high-resolution X-ray imaging. With the high X-ray flux available from synchrotron sources and recent advances in high-speed visible-light cameras, these measurements are increasingly used to obtain time-resolved images of dynamic phenomena. The X-ray flux on the scintillator must, in many cases, be limited to avoid thermal damage and failure of the scintillator, which in turn limits the obtainable light levels from the scintillator. In this study, a transient one-dimensional numerical simulation of the temperature and stresses within three common scintillator crystals (YAG, LuAG and LSO) used for high-speed X-ray imaging is presented. Various conditions of thermal loading and convective cooling are also presented.
使用单晶闪烁体间接检测X射线是高分辨率X射线成像的常用方法。随着同步辐射源可提供的高X射线通量以及高速可见光相机的最新进展,这些测量越来越多地用于获取动态现象的时间分辨图像。在许多情况下,必须限制闪烁体上的X射线通量,以避免闪烁体受到热损伤和失效,这反过来又限制了从闪烁体获得的光水平。在本研究中,对用于高速X射线成像的三种常见闪烁体晶体(YAG、LuAG和LSO)内的温度和应力进行了瞬态一维数值模拟。还给出了各种热负载和对流冷却条件。