Key Laboratory for Precision and Non-traditional Machining Technology of the Ministry of Education, Dalian University of Technology, Dalian 116024, China.
Phys Chem Chem Phys. 2019 Jan 30;21(5):2540-2546. doi: 10.1039/c8cp06645k.
Two-dimensional (2D) organic-inorganic hybrid perovskites, which possess outstanding optical and electrical properties, are promising semiconductor materials that have attracted significant interest in widespread applications. The frictional behavior of 2D perovskite materials with other transparent conductive materials, such as indium tin oxide (ITO), offers promising developments in optoelectronic devices. Therefore, the understanding of this frictional behavior is essential. Atomic force microscopy (AFM) is employed here to measure the frictional behavior between the (001) plane of the 2D organic-inorganic hybrid (C4H9NH3)2PbBr4 perovskite and the (111) plane of the ITO. The experimental analyses characterizing the nature of the friction in a single-crystalline heterojunction are reported. Based on the results of the analyses of interfaces between 2D monolayer perovskites and ITO, a strong anisotropy of friction is clearly demonstrated. The anisotropy of friction is observed as a four-fold symmetry with low a frictional coefficient, 0.035, in misaligned contacts, and, 0.015, in aligned contacts in the heterojunction configuration. In addition, atomistic simulations reveal underlying frictional mechanisms in the dynamical regimes. A new phenomenon discovered in the studies establishes that the measured frictional anisotropy surprisingly depends on the number of atomic layers in the 2D perovskite. The frictional anisotropy decreases significantly with the increase in the number of layers up to 16 layers, and then it becomes independent of the thickness. Our results are predicted to be of a general nature and should be applicable to other 2D hybrid perovskite heterojunction configurations, and thus, furthers the development of adaptive and stretchable optoelectronic nanodevices.
二维(2D)有机-无机杂化钙钛矿具有出色的光学和电学性能,是一种很有前途的半导体材料,在广泛的应用中引起了极大的关注。2D 钙钛矿材料与其他透明导电材料(如氧化铟锡(ITO))之间的摩擦行为为光电设备的发展提供了广阔的前景。因此,了解这种摩擦行为是至关重要的。原子力显微镜(AFM)用于测量 2D 有机-无机杂化(C4H9NH3)2PbBr4 钙钛矿的(001)面与 ITO 的(111)面之间的摩擦行为。报道了对单晶异质结中摩擦特性进行的实验分析。基于对二维单层钙钛矿和 ITO 之间界面的分析结果,明显证明了摩擦的各向异性。在异质结结构中,在不对准接触时,摩擦的各向异性表现为四阶对称,摩擦系数低,为 0.035,在对准接触时,摩擦系数为 0.015。此外,原子模拟揭示了动态状态下的潜在摩擦机制。在研究中发现了一种新现象,即测量到的摩擦各向异性出人意料地取决于 2D 钙钛矿中的原子层数。摩擦各向异性随着层数的增加而显著减小,在达到 16 层后,它变得与厚度无关。我们的结果具有普遍意义,应该适用于其他 2D 杂化钙钛矿异质结结构,从而推动了自适应和可拉伸光电纳米器件的发展。