Department of Mining and Materials Engineering,McGill University,Montreal, Quebec,Canada H3A 0C5.
Centre d'excellence en électrification des transports et stockage d'énergie,Hydro-Québec,Varennes,Québec,Canada J3X 1S1.
Microsc Microanal. 2019 Feb;25(1):58-69. doi: 10.1017/S1431927618015684. Epub 2019 Feb 4.
The f-ratio quantitative X-ray microanalysis method has been recently developed for binary systems based on a scanning electron microscope/energy dispersive spectroscopy (SEM/EDS) system. This method incorporates traditional EDS experiments and Monte Carlo simulations, and calibration factors are calculated with standard samples to evaluate the differences between them. In this work, the f-ratio method was extended to Mg-Al-Zn multi-element systems using a cold field emission SEM and a tungsten emission SEM. Results show that the stability of the beam current does not influence the f-ratio quantification accuracy. Thus, the f-ratio method is suitable for quantitative X-ray mapping with a long-time acquisition or even an unstable beam current. Comparing with other quantitative techniques including the routine standardless analysis and the standard-based k-ratio method, the f-ratio method is a simple and accurate quantification method.
最近，一种基于扫描电子显微镜/能量色散谱（SEM/EDS）系统的二元系统 f-比值定量 X 射线微分析方法已经被开发出来。该方法结合了传统的 EDS 实验和蒙特卡罗模拟，并使用标准样品计算校准因子以评估它们之间的差异。在这项工作中，使用冷场发射 SEM 和钨发射 SEM 将 f-比值方法扩展到 Mg-Al-Zn 多元素系统。结果表明，束流电流的稳定性不会影响 f-比值定量的准确性。因此，f-比值方法适用于具有长时间采集甚至不稳定束流的定量 X 射线映射。与包括常规无标样分析和基于标准的 k-比值方法在内的其他定量技术相比，f-比值方法是一种简单而准确的定量方法。
