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一种采用挤压薄膜阻尼提高阈值精度的A5惯性微开关。

A 5 Inertial Micro-Switch with Enhanced Threshold Accuracy Using Squeeze-Film Damping.

作者信息

Peng Yingchun, Wu Guoguo, Pan Chunpeng, Lv Cheng, Luo Tianhong

机构信息

College of Mechanical and Electrical Engineering, Chongqing University of Arts and Sciences, Chongqing 402160, China.

出版信息

Micromachines (Basel). 2018 Oct 23;9(11):539. doi: 10.3390/mi9110539.

Abstract

Our previous report based on a 10 (gravity) silicon-based inertial micro-switch showed that the contact effect between the two electrodes can be improved by squeeze-film damping. As an extended study toward its potential applications, the switch with a large proof mass suspended by four flexible serpentine springs was redesigned to achieve 5 threshold value and enhanced threshold accuracy. The impact of the squeeze-film damping on the threshold value was theoretically studied. The theoretical results show that the threshold variation from the designed value due to fabrication errors can be reduced by optimizing the device thickness (the thickness of the proof mass and springs) and then establishing a tradeoff between the damping and elastic forces, thus improving the threshold accuracy. The design strategy was verified by FEM (finite-element-method) simulation and an experimental test. The simulation results show that the maximum threshold deviation was only 0.15 , when the device thickness variation range was 16⁻24 μm, which is an adequately wide latitude for the current bulk silicon micromachining technology. The measured threshold values were 4.9⁻5.8 and the device thicknesses were 18.2⁻22.5 μm, agreeing well with the simulation results. The measured contact time was 50 μs which is also in good agreement with our previous work.

摘要

我们之前基于一个10(重力)的硅基惯性微开关的报告表明,通过挤压薄膜阻尼可以改善两个电极之间的接触效果。作为对其潜在应用的扩展研究,重新设计了一种由四个柔性蛇形弹簧悬挂大质量块的开关,以实现5的阈值和更高的阈值精度。从理论上研究了挤压薄膜阻尼对阈值的影响。理论结果表明,通过优化器件厚度(质量块和弹簧的厚度),然后在阻尼力和弹力之间进行权衡,可以减少由于制造误差导致的阈值与设计值之间的偏差,从而提高阈值精度。通过有限元方法(FEM)模拟和实验测试验证了该设计策略。模拟结果表明,当器件厚度变化范围为16⁻24μm时,最大阈值偏差仅为0.15,这对于当前的体硅微加工技术来说是一个足够宽的范围。测量得到的阈值为4.9⁻5.8,器件厚度为18.2⁻22.5μm,与模拟结果吻合良好。测量得到的接触时间为50μs,这也与我们之前的工作吻合良好。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3e0e/6266094/6e276f805630/micromachines-09-00539-g001.jpg

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