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通过氮掺杂制备的P型铌酸锂薄膜

P-Type Lithium Niobate Thin Films Fabricated by Nitrogen-Doping.

作者信息

Li Wencan, Cui Jiao, Wang Weiwei, Zheng Dahuai, Jia Longfei, Saeed Shahzad, Liu Hongde, Rupp Romano, Kong Yongfa, Xu Jingjun

机构信息

The MOE Key Laboratory of Weak-Light Nonlinear Photonics and TEDA Institute of Applied Physics, Nankai University, Tianjin 300457, China.

School of Physics, Nankai University, Tianjin 300071, China.

出版信息

Materials (Basel). 2019 Mar 11;12(5):819. doi: 10.3390/ma12050819.

Abstract

Nitrogen-doped lithium niobate (LiNbO₃:N) thin films were successfully fabricated on a Si-substrate using a nitrogen plasma beam supplied through a radio-frequency plasma apparatus as a dopant source via a pulsed laser deposition (PLD). The films were then characterized using X-Ray Diffraction (XRD) as polycrystalline with the predominant orientations of (012) and (104). The perfect surface appearance of the film was investigated by atomic force microscopy and Hall-effect measurements revealed a rare p-type conductivity in the LiNbO₃:N thin film. The hole concentration was 7.31 × 10 cm with a field-effect mobility of 266 cm²Vs. X-ray Photoelectron Spectroscopy (XPS) indicated that the atom content of nitrogen was 0.87%; N atoms were probably substituted for O sites, which contributed to the p-type conductivity. The realization of p-type LiNbO₃:N thin films grown on the Si substrate lead to improvements in the manufacturing of novel optoelectronic devices.

摘要

通过脉冲激光沉积(PLD),利用射频等离子体装置提供的氮等离子体束作为掺杂源,在硅衬底上成功制备了氮掺杂铌酸锂(LiNbO₃:N)薄膜。然后使用X射线衍射(XRD)对薄膜进行表征,结果表明其为多晶结构,主要取向为(012)和(104)。通过原子力显微镜研究了薄膜完美的表面形貌,霍尔效应测量表明LiNbO₃:N薄膜具有罕见的p型导电性。空穴浓度为7.31×10 cm,场效应迁移率为266 cm²Vs。X射线光电子能谱(XPS)表明氮的原子含量为0.87%;N原子可能取代了O位,这促成了p型导电性。在硅衬底上生长p型LiNbO₃:N薄膜有助于新型光电器件制造的改进。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/eeb4/6427647/1baf44946c07/materials-12-00819-g001.jpg

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