Russell Gerald E
U.S. Food and Drug Administration, 1560 E. Jefferson Avenue, Detroit, Michigan 48207.
J Food Prot. 1988 Jul;51(7):547-553. doi: 10.4315/0362-028X-51.7.547.
Soft white wheat was infested with adult granary weevils under controlled conditions at 3 levels of infestation, and samples were removed for testing 6 times over a total of 48 d. Three analytical methods available for use in FDA laboratories were compared along with a simple counting of the visually-detectable, insect-damaged kernels in a 100-g sample. The objective of the study was to determine how the analytical results compared with one another and with the levels of infestation. Data confirmed that the more rapid visual exam of wheat is not reliable for indicating the hidden, internally-developing weevils. Analysts should be aware of the possibility that wheat inspected visually could be passable with respect to insect-damaged kernels, but still may produce violative flour due to high insect fragment counts when processed. More research is needed to correlate insect infestation in wheat with insect fragment counts in flour. The two methods which could be used to estimate potential flour contamination caused by weevils are the x-ray exam and the cracking and flotation method, since both of these reveal the stages of weevil development inside the kernels. Tables present the results of the analyses and relate them to the number and sex of the founding adults in each level of infestation.
在可控条件下，将软质白小麦用谷象成虫以3个侵染水平进行侵染，并在总共48天内6次取样进行检测。对美国食品药品监督管理局（FDA）实验室可用的三种分析方法进行了比较，同时还对100克样品中肉眼可见的、受昆虫损害的谷粒进行了简单计数。该研究的目的是确定分析结果之间以及与侵染水平相比情况如何。数据证实，对小麦进行的更快速的目视检查对于指示隐藏在内部发育的谷象并不可靠。分析人员应意识到，目视检查的小麦在昆虫损害谷粒方面可能合格，但在加工时由于昆虫碎片数量高仍可能产生违规面粉。需要更多研究来关联小麦中的昆虫侵染与面粉中的昆虫碎片数量。可用于估计谷象造成的潜在面粉污染的两种方法是X射线检查和破碎浮选法，因为这两种方法都能揭示谷粒内部谷象的发育阶段。表格列出了分析结果，并将其与每个侵染水平下初始成虫的数量和性别相关联。
