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弃用还是不弃用:起搏器和植入式心律转复除颤器导线弃用的晚期后果

To abandon or not to abandon: Late consequences of pacing and ICD lead abandonment.

作者信息

Jacheć Wojciech, Polewczyk Anna, Segreti Luca, Bongiorni Maria Grazia, Kutarski Andrzej

机构信息

2nd Department of Cardiology, Medical University of Silesia, School of Medicine with the Division of Dentistry in Zabrze, Zabrze, Poland.

Faculty of Medicine and Health Sciences Kielce, The Jan Kochanowski University, Kielce, Poland.

出版信息

Pacing Clin Electrophysiol. 2019 Jul;42(7):1006-1017. doi: 10.1111/pace.13715. Epub 2019 May 13.

Abstract

INTRODUCTION

The increasing number of cardiac implantable electronic device complications represents a current problem. Abandoned leads are difficult to manage, even because indications to transvenous lead extraction (TLE) cannot be generalized. The aim of the study was to assess the late consequences of previous abandoned leads.

METHODS

We did a retrospective analysis of clinical data from 3,810 patients undergoing TLE in two high-volume centers (Poland and Italy) in the years 2006-2017. In order to evaluate the effects of lead abandonment, the patients were divided into a group of 582 (15.3%) subjects with abandoned leads (AL) and a group of 3,228 (84.7%) subjects with functional leads (FL).

RESULTS

Infective indications to TLE were predominant in the AL group (61.34% vs 43.4%; P < 0.001). AL was associated with a higher number of leads per patient, longer lead dwell times, more frequent venous occlusion, higher probability of intracardiac lead abrasion, and tricuspid regurgitation (P < 0.001 for all factors). The presence of AL was connected with more frequent technical complications of TLE (odds ratio [OR] 1.617; confidence interval [CI] 1.412-1.852; P = 0.000), lower procedural success rate (OR 0.270; CI 0.199-0.363; P = 0.000), and with higher mortality rate during 3.518 years of follow-up [hazard ratio 1.286; 95% CI (1.062-1.558), P = 0.010].

CONCLUSIONS

Presence of previously abandoned leads was associated with the risk of device infections, technical problems during subsequent lead extraction, dysfunction of tricuspid valve, and worse long-term outcomes.

摘要

引言

心脏植入式电子设备并发症数量的不断增加是当前一个问题。废弃导线难以处理,这甚至是因为经静脉导线拔除术(TLE)的指征无法一概而论。本研究的目的是评估既往废弃导线的远期后果。

方法

我们对2006年至2017年在两个高容量中心(波兰和意大利)接受TLE的3810例患者的临床资料进行了回顾性分析。为了评估导线废弃的影响,将患者分为582例(15.3%)有废弃导线(AL)的受试者组和3228例(84.7%)有功能导线(FL)的受试者组。

结果

TLE的感染指征在AL组中占主导地位(61.34%对43.4%;P<0.001)。AL与每位患者更多的导线数量、更长的导线留置时间、更频繁的静脉闭塞、更高的心内导线磨损概率以及三尖瓣反流相关(所有因素P<0.001)。AL的存在与TLE更频繁的技术并发症相关(比值比[OR]1.617;置信区间[CI]1.412 - 1.852;P = 0.000),手术成功率较低(OR 0.270;CI 0.199 - 0.363;P = 0.000),并且在3.518年的随访期间死亡率较高[风险比1.286;95%CI(1.062 - 1.558),P = 0.010]。

结论

既往存在废弃导线与设备感染风险、后续导线拔除期间的技术问题、三尖瓣功能障碍以及更差的长期预后相关。

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