School of Electronics and Information Engineering, Anhui University, Hefei, China.
PLoS One. 2019 May 28;14(5):e0217168. doi: 10.1371/journal.pone.0217168. eCollection 2019.
This paper focuses on fine-grained image retrieval based on sketches. Sketches capture detailed information, but their highly abstract nature makes visual comparisons with images more difficult. In spite of the fact that the existing models take into account the fine-grained details, they can not accurately highlight the distinctive local features and ignore the correlation between features. To solve this problem, we design a gradually focused bilinear attention model to extract detailed information more effectively. Specifically, the attention model is to accurately focus on representative local positions, and then use the weighted bilinear coding to find more discriminative feature representations. Finally, the global triplet loss function is used to avoid oversampling or undersampling. The experimental results show that the proposed method outperforms the state-of-the-art sketch-based image retrieval methods.
本文专注于基于草图的细粒度图像检索。草图捕捉到详细信息,但它们高度抽象的性质使得与图像的视觉比较更加困难。尽管现有的模型考虑到了细粒度的细节,但它们不能准确地突出独特的局部特征,并且忽略了特征之间的相关性。为了解决这个问题,我们设计了一种逐渐聚焦的双线性注意力模型,以更有效地提取详细信息。具体来说,注意力模型是准确地关注有代表性的局部位置,然后使用加权双线性编码来找到更具判别力的特征表示。最后,使用全局三元组损失函数来避免过采样或欠采样。实验结果表明,所提出的方法优于最先进的基于草图的图像检索方法。