Paananen Riku O, Javanainen Matti, Holopainen Juha M, Vattulainen Ilpo
Helsinki Eye Lab, Department of Ophthalmology , University of Helsinki and Helsinki University Hospital , FI-00014 Helsinki , Finland.
J. Heyrovský Institute of Physical Chemistry , Czech Academy of Sciences , CZ-18223 Prague 8 , Czech Republic.
J Phys Chem Lett. 2019 Jul 18;10(14):3893-3898. doi: 10.1021/acs.jpclett.9b01187. Epub 2019 Jul 1.
Dry eye syndrome (DES), one of the most common ophthalmological diseases, is typically caused by excessive evaporation of tear fluid from the ocular surface. Excessive evaporation is linked to impaired function of the tear film lipid layer (TFLL) that covers the aqueous tear film. The principles of the evaporation resistance of the TFLL have remained unknown, however. We combined atomistic simulations with Brewster angle microscopy and surface potential experiments to explore the organization and evaporation resistance of films composed of wax esters, one of the main components of the TFLL. The results provide evidence that the evaporation resistance of the TFLL is based on crystalline-state layers of wax esters and that the evaporation rate is determined by defects in the TFLL and its coverage on the ocular surface. On the basis of the results, uncovering the nonequilibrium spreading and crystallization of TFLL films has potential to reveal new means of treating DES.
干眼综合征(DES)是最常见的眼科疾病之一,通常由眼表泪液过度蒸发所致。过度蒸发与覆盖泪膜水层的泪膜脂质层(TFLL)功能受损有关。然而,TFLL的抗蒸发原理尚不清楚。我们将原子模拟与布鲁斯特角显微镜和表面电位实验相结合,以探究由蜡酯(TFLL的主要成分之一)组成的薄膜的组织结构和抗蒸发性能。结果表明,TFLL的抗蒸发性能基于蜡酯的晶态层,蒸发速率由TFLL中的缺陷及其在眼表的覆盖情况决定。基于这些结果,揭示TFLL薄膜的非平衡铺展和结晶过程有可能为治疗DES找到新方法。