Alessandretti Rodrigo, Ribeiro Raissa, Borba Marcia, Bona Alvaro Della
Postgraduate Program in Dentistry, Dental School, UPF - Universidade de Passo Fundo, Passo Fundo, RS, Brazil.
Braz Dent J. 2019 Jul 22;30(4):380-384. doi: 10.1590/0103-6440201902574.
This study evaluated the fracture load (Lf) and the failure mode of CAD-on (Ivoclar Vivadent) ceramic structures, testing the hypotheses that Lf of multilayer structures is governed by the veneering ceramic strength and that chipping is more frequent in multilayer than monolithic structures. Disc-shaped specimens were fabricated as follows: CAD-on- trilayer structure composed of Y-TZP (yttria stabilized tetragonal zirconia polycrystal- IPS e.max ZirCAD) infrastructure, fusion glass-ceramic (IPS e.max CAD Crystall/Connect) and lithium disilicate-based glass-ceramic (IPS e.max CAD); YLD- bilayer structure composed of Y-TZP infrastructure and fluorapatite layering ceramic (IPS e.max Ceram); LDC- monolithic lithium-disilicate glass-ceramic (IPS e.max CAD); and YZW- monolithic Y-TZP (Zenostar Zr Translucent). The specimens were loaded in compression until failure and fracture surfaces were evaluated using fractographic principles. Lf values were statistically analyzed using the Weibull statistics, Kruskal-Wallis and Dunn tests (a= 0.05). YZW (1329 N) and CAD-on (1085 N) showed the greatest Lf median values, followed by YLD (832 N) and LDC (421 N). All monolithic structures (LDC and YZW) fractured catastrophically and all YLD structures failed by chipping. The CAD-on technique seems to be a very promising fabrication process because it showed high Lf, similar to monolithic zirconia, and small chipping rate.
本研究评估了CAD-on(义获嘉伟瓦登特公司)陶瓷结构的断裂载荷(Lf)和失效模式,检验了以下假设:多层结构的Lf受贴面陶瓷强度控制,且多层结构比整体结构更易出现崩瓷。圆盘状试样制备如下:CAD-on三层结构,由Y-TZP(钇稳定四方氧化锆多晶体——IPS e.max ZirCAD)底层结构、熔合玻璃陶瓷(IPS e.max CAD Crystall/Connect)和硅酸锂基玻璃陶瓷(IPS e.max CAD)组成;YLD双层结构,由Y-TZP底层结构和氟磷灰石层状陶瓷(IPS e.max Ceram)组成;LDC整体式硅酸锂玻璃陶瓷(IPS e.max CAD);以及YZW整体式Y-TZP(Zenostar Zr Translucent)。对试样进行压缩加载直至失效,并使用断口分析原理评估断口表面。使用威布尔统计、克鲁斯卡尔-沃利斯检验和邓恩检验(α = 0.05)对Lf值进行统计分析。YZW(1329 N)和CAD-on(1085 N)的Lf中位数最高,其次是YLD(832 N)和LDC(421 N)。所有整体结构(LDC和YZW)均发生灾难性断裂,所有YLD结构均因崩瓷而失效。CAD-on技术似乎是一种非常有前景的制造工艺,因为它显示出与整体式氧化锆相似的高Lf以及较低的崩瓷率。