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自组装纳米结构a-Si:Al的表面效应与光学性质

Surface Effects and Optical Properties of Self-Assembled Nanostructured a-Si:Al.

作者信息

Kjeldstad Torunn, Thøgersen Annett, Stange Marit, Jensen Ingvild Thue, Monakhov Eduard, Galeckas Augustinas

机构信息

Department of Physics/Centre for Materials Science and Nanotechnology, University of Oslo, P.O. Box 1048 Blindern, N-0316 Oslo, Norway.

SINTEF Industry, P.O. Box 124 Blindern, 0314 Oslo, Norway.

出版信息

Nanomaterials (Basel). 2019 Aug 1;9(8):1106. doi: 10.3390/nano9081106.

DOI:10.3390/nano9081106
PMID:31375018
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC6723699/
Abstract

We present a study of the surface effects and optical properties of the self-assembled nanostructures comprised of vertically aligned 5 nm-diameter Al nanowires embedded in an amorphous Si matrix (a-Si:Al). The controlled (partial) removal of Al nanowires in a selective etching process yielded nanoporous a-Si media with a variable effective surface area. Different spectroscopy techniques, such as X-ray photoelectron spectroscopy (XPS), UV-Vis spectrophotometry and photoluminescence (PL), have been combined to investigate the impact of such nanostructuring on optical absorption and emission properties. We also examine long-term exposure to air ambient and show that increasing level of surface oxidation determines the oxide defect-related nature of the dominant PL emission from the nanoporous structures. The role of bulk, nanosize and surface effects in optical properties has been separated and quantified, providing a better understanding of the potential of such nanoporous a-Si:Al structures for future device developments.

摘要

我们展示了一项关于自组装纳米结构的表面效应和光学性质的研究,该纳米结构由嵌入非晶硅基质(a-Si:Al)中的垂直排列的直径为5纳米的铝纳米线组成。在选择性蚀刻过程中对铝纳米线进行可控(部分)去除,得到了具有可变有效表面积的纳米多孔a-Si介质。不同的光谱技术,如X射线光电子能谱(XPS)、紫外-可见分光光度法和光致发光(PL),已被结合起来研究这种纳米结构对光吸收和发射性质的影响。我们还研究了长期暴露在空气环境中的情况,并表明表面氧化程度的增加决定了纳米多孔结构中主导PL发射的与氧化物缺陷相关的性质。已将体效应、纳米尺寸效应和表面效应在光学性质中的作用分离并量化,从而更好地理解这种纳米多孔a-Si:Al结构在未来器件开发中的潜力。

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1
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本文引用的文献

1
Monitoring selective etching of self-assembled nanostructured a-Si:Al films.监测自组装纳米结构的非晶硅:铝薄膜的选择性刻蚀。
Nanotechnology. 2019 Mar 29;30(13):135601. doi: 10.1088/1361-6528/aafb86. Epub 2019 Jan 2.
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Nanotechnology. 2018 Aug 3;29(31):315602. doi: 10.1088/1361-6528/aac36a. Epub 2018 May 9.
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