Jeong Youngsoon, Hong Chanwoo, Jung Yeong Hun, Akter Rashida, Yoon Hana, Yoon Ilsun
Department of Chemistry, Chungnam National University, Daejeon, 34134, Republic of Korea.
Korea Institute of Energy Research (KIER), Daejeon, 34129, Republic of Korea.
Sci Rep. 2019 Nov 4;9(1):15914. doi: 10.1038/s41598-019-52382-4.
Metal-assisted chemical etching (MACE) has been widely explored for developing silicon (Si)-based energy and optical devices with its benefits for low-cost and large-area fabrication of Si nanostructures of high aspect ratios. Surface structures and properties of Si nanostructures fabricated through MACE are significantly affected by experimental and environmental conditions of etchings. Herein, we showed that surfaces and interfacial energy states of fabricated Si nanowires can be critically affected by oxidants of MACE etching solutions. Surfaces of fabricated Si nanowires are porous and their tips are fully covered with lots of Si nano-sized grains. Strongly increased photoluminescence (PL) intensities, compared to that of the crystalline Si substrate, are observed for MACE-fabricated Si nanowires due to interfacial energy states of Si and SiO of Si nano-sized grains. These Si grains can be completely removed from the nanowires by an additional etching process of the anisotropic chemical etching (ACE) of Si to taper the nanowires and enhance light trapping of the nanowires. Compared with the MACE-fabricated Si nanowires, ACE-fabricated tapered Si nanowires have similar Raman and PL spectra to those of the crystalline Si substrate, indicating the successful removal of Si grains from the nanowire surfaces by the ACE process.
金属辅助化学蚀刻(MACE)已被广泛用于开发基于硅(Si)的能源和光学器件,因为它有利于低成本、大面积制造高纵横比的硅纳米结构。通过MACE制造的硅纳米结构的表面结构和性质受到蚀刻实验和环境条件的显著影响。在此,我们表明,MACE蚀刻溶液中的氧化剂会严重影响所制造硅纳米线的表面和界面能态。所制造硅纳米线的表面是多孔的,其尖端完全覆盖着许多纳米尺寸的硅晶粒。由于硅纳米晶粒的Si和SiO的界面能态,与晶体硅衬底相比,MACE制造的硅纳米线观察到光致发光(PL)强度显著增加。通过对硅进行各向异性化学蚀刻(ACE)的额外蚀刻工艺来使纳米线变细并增强纳米线的光捕获,可以将这些硅晶粒从纳米线中完全去除。与MACE制造的硅纳米线相比,ACE制造的锥形硅纳米线具有与晶体硅衬底相似的拉曼光谱和PL光谱,这表明通过ACE工艺成功地从纳米线表面去除了硅晶粒。