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纳米和微米颗粒尺寸以及光子能量对铋硅屏蔽材料在诊断放射学中质量衰减系数的影响。

Influence of the size of nano- and microparticles and photon energy on mass attenuation coefficients of bismuth-silicon shields in diagnostic radiology.

作者信息

Malekzadeh Reza, Mehnati Parinaz, Sooteh Mohammad Yousefi, Mesbahi Asghar

机构信息

Medical Radiation Sciences Research Team, Tabriz University of Medical Sciences, Tabriz, Iran.

Department of Medical Physics, School of Medicine, Tabriz University of Medical Sciences, Tabriz, Iran.

出版信息

Radiol Phys Technol. 2019 Sep;12(3):325-334. doi: 10.1007/s12194-019-00529-3. Epub 2019 Aug 5.

Abstract

Recent studies have shown that the particle size of the shielding material and photon energy has significant effects on the efficiency of radiation-shielding materials. The purpose of the current study was to investigate the shielding properties of the bismuth-silicon (Bi-Si) composite containing varying percentages of micro- and nano-sized Bi particles for low-energy X-rays. Radiation composite shields composed of nano- and micro-sized Bi particles in Si-based matrix were constructed. The mass attenuation coefficients of the designed shields were experimentally assessed for diagnostic radiology energy range. In addition, the mass attenuation coefficients of the composite were comprehensively investigated using the MCNPX Monte Carlo (MC) code and XCOM. The X-ray attenuation for two different micro-sized Bi composites of radii of 50 µm and 0.50 µm showed enhancement in the range of 37-79% and 5-24%, respectively, for mono-energy photons (60-150 keV). Furthermore, the experimental and MC results indicated that nano-structured composites had higher photon attenuation properties (approximately 11-18%) than those of micro-sized samples for poly-energy X-ray photons. The amount of radiation attenuation for lower energies was more than that of higher energies. Thus, it was found that the shielding properties of composites were considerably strengthened by adding Bi nano-particles for lower energy photons.

摘要

最近的研究表明,屏蔽材料的粒径和光子能量对辐射屏蔽材料的效率有显著影响。本研究的目的是研究含有不同百分比的微米级和纳米级铋颗粒的铋硅(Bi-Si)复合材料对低能X射线的屏蔽性能。构建了由纳米级和微米级铋颗粒在硅基基质中组成的辐射复合屏蔽体。针对诊断放射学能量范围,通过实验评估了设计屏蔽体的质量衰减系数。此外,使用MCNPX蒙特卡罗(MC)代码和XCOM全面研究了复合材料的质量衰减系数。对于半径分别为50 µm和0.50 µm的两种不同微米级铋复合材料,单能光子(60 - 150 keV)的X射线衰减分别在37 - 79%和5 - 24%的范围内增强。此外,实验和MC结果表明,对于多能X射线光子,纳米结构复合材料比微米级样品具有更高的光子衰减性能(约11 - 18%)。较低能量的辐射衰减量大于较高能量的辐射衰减量。因此,发现通过添加铋纳米颗粒,复合材料对低能光子的屏蔽性能得到了显著增强。

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