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使用XP-endo修整器评估碎屑和玷污层的去除:一项扫描电子显微镜研究。

Evaluation of debris and smear layer removal with XP-endo finisher: A scanning electron microscopic study.

作者信息

Jayakumaar Anita, Ganesh Arathi, Kalaiselvam Rajeswari, Rajan Mathan, Deivanayagam Kandaswamy

机构信息

Department of Conservative Dentistry and Endodontics, Faculty of Dental Sciences, Sri Ramachandra University, Chennai, Tamil Nadu, India.

出版信息

Indian J Dent Res. 2019 May-Jun;30(3):420-423. doi: 10.4103/ijdr.IJDR_655_17.

Abstract

CONTEXT

The presence of smear layer and debris can prevent the irrigant and sealer from penetrating the dentinal tubules thereby compromising the seal of the root canal filling.

AIM

This study aims to evaluate the efficacy of XP-endo Finisher with ProTaper Next and HyFlex in smear layer and debris removal.

MATERIALS AND METHODS

: Thirty-two extracted mandibular premolar teeth were selected and sectioned at the cementoenamel junction. The roots were then randomly divided into 4 groups. In group 1 and 2, canals were instrumented with X ProTaper Next (25 0.06 taper). In group 3 and 4, canals were instrumented with HyFlex system (25 0.06 taper). The canals in group 2 and 4 were further finished with XP-endo Finisher. Irrigation was carried out using 3% sodium hypochlorite during instrumentation, and 17% ethylenediaminetetraacetic acid was used as the final rinse. The roots were then split longitudinally. The canal wall was observed under the scanning electron microscope in coronal, middle, and apical thirds at a magnification of ×400 and ×1000 for evaluation of debris and smear layer, respectively. Photomicrographs were taken, and qualitative assessment for debris and smear layer removal was done.

STATISTICAL ANALYSIS USED

The results were analyzed using Kruskal-Wallis test and Mann-Whitney U-test.

RESULTS

Lower debris and smear layer scores were seen in canal thirds instrumented with ProTaper Next and XP-endo Finisher (P < 0.01).

CONCLUSION

The use of XP-endo Finisher as an adjuvant during shaping and cleaning produced cleaner root canal walls.

摘要

背景

玷污层和碎屑的存在会阻止冲洗剂和封闭剂渗入牙本质小管,从而损害根管充填的密封性。

目的

本研究旨在评估XP-endo Finisher联合ProTaper Next和HyFlex去除玷污层和碎屑的效果。

材料与方法

选取32颗拔除的下颌前磨牙,在牙骨质釉质界处进行切片。然后将牙根随机分为4组。第1组和第2组,使用X ProTaper Next(25 0.06锥度)对根管进行预备。第3组和第4组,使用HyFlex系统(25 0.06锥度)对根管进行预备。第2组和第4组的根管进一步使用XP-endo Finisher进行修整。预备过程中使用3%次氯酸钠进行冲洗,最后使用17%乙二胺四乙酸进行冲洗。然后将牙根纵向劈开。在扫描电子显微镜下,分别以×400和×1000的放大倍数观察根管壁的冠部、中部和根尖三分之一处,以评估碎屑和玷污层情况。拍摄显微照片,并对碎屑和玷污层的去除情况进行定性评估。

使用的统计分析方法

结果采用Kruskal-Wallis检验和Mann-Whitney U检验进行分析。

结果

使用ProTaper Next和XP-endo Finisher预备的根管三分之一处,碎屑和玷污层评分较低(P < 0.01)。

结论

在根管预备和清洁过程中使用XP-endo Finisher作为辅助工具,可使根管壁更清洁。

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