Kim Jungpil, Lee Nodo, Min Young Hwan, Noh Seokhwan, Kim Nam-Koo, Jung Seokwon, Joo Minho, Yamada Yasuhiro
Materials & Devices Advanced Research Institute, LG Electronics, 10, Magokjungang-ro, Gangseo-gu, Seoul 07796, Republic of Korea.
Graduate School of Engineering, Chiba University, 1-33 Yayoi, Inage, Chiba 263-8522, Japan.
ACS Omega. 2018 Dec 19;3(12):17789-17796. doi: 10.1021/acsomega.8b02744. eCollection 2018 Dec 31.
Graphene nanoribbons (GNRs) have recently emerged as alternative 2D semiconductors owing to their fascinating electronic properties that include tunable band gaps and high charge-carrier mobilities. Identifying the atomic-scale edge structures of GNRs through structural investigations is very important to fully understand the electronic properties of these materials. Herein, we report an atomic-scale analysis of GNRs using simulated X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. Tetracene with zigzag edges and chrysene with armchair edges were selected as initial model structures, and their XPS and Raman spectra were analyzed. Structurally expanded nanoribbons based on tetracene and chrysene, in which zigzag and armchair edges were combined in various ratios, were then simulated. The edge structures of chain-shaped nanoribbons composed only of either zigzag edges or armchair edges were distinguishable by XPS and Raman spectroscopy, depending on the edge type. It was also possible to distinguish planar nanoribbons consisting of both zigzag and armchair edges with zigzag/armchair ratios of 4:1 or 1:4, indicating that it is possible to analyze normally synthesized GNRs because their zigzag to armchair edge ratios are usually greater than 4 or less than 0.25. Our study on the precise identification of GNR edge structures by XPS and Raman spectroscopy provides the groundwork for the analysis of GNRs.
石墨烯纳米带(GNRs)近来作为二维半导体的替代品崭露头角,这得益于其迷人的电子特性,包括可调节的带隙和高电荷载流子迁移率。通过结构研究确定GNRs的原子尺度边缘结构对于全面理解这些材料的电子特性非常重要。在此,我们报告了使用模拟X射线光电子能谱(XPS)和拉曼光谱对GNRs进行的原子尺度分析。选择具有锯齿形边缘的并四苯和具有扶手椅形边缘的蒽作为初始模型结构,并对它们的XPS和拉曼光谱进行了分析。然后模拟了基于并四苯和蒽的结构扩展纳米带,其中锯齿形和扶手椅形边缘以各种比例组合。仅由锯齿形边缘或扶手椅形边缘组成的链状纳米带的边缘结构可以通过XPS和拉曼光谱区分,这取决于边缘类型。还能够区分由锯齿形/扶手椅形比例为4:1或1:4的锯齿形和扶手椅形边缘组成的平面纳米带,这表明有可能分析正常合成的GNRs,因为它们的锯齿形与扶手椅形边缘比例通常大于4或小于0.25。我们通过XPS和拉曼光谱对GNR边缘结构进行精确识别的研究为GNRs的分析奠定了基础。