• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

SEM 中具有改进背散射电子检测器的 3D 表面形貌成像:布置和重建算法。

3D surface topography imaging in SEM with improved backscattered electron detector: Arrangement and reconstruction algorithm.

机构信息

Department of Mathematics, Faculty of Physics, Lomonosov Moscow State University, Moscow 119991, Russia.

Department of Physical Electronics, Faculty of Physics, Lomonosov Moscow State University, Moscow 119991, Russia.

出版信息

Ultramicroscopy. 2019 Dec;207:112830. doi: 10.1016/j.ultramic.2019.112830. Epub 2019 Aug 23.

DOI:10.1016/j.ultramic.2019.112830
PMID:31494480
Abstract

We propose a new SFS (shape from shading) technique for improved 3D surface reconstruction and imaging of relatively smooth surface topography using the scanning electron microscope (SEM). The new arrangement of backscattered electrons detector plates allows decreasing the initial energy of the electron probe, which makes this SEM technique to be suitable for usage on radiation-sensitive samples like biological tissues. Experiments show high effectiveness of the method, which improves both the gradient sensitivity of the signal and the signal to noise ratio.

摘要

我们提出了一种新的阴影恢复形状(SFS)技术,用于利用扫描电子显微镜(SEM)改善相对平滑表面形貌的 3D 表面重建和成像。新的背散射电子探测器板的布置允许降低电子探针的初始能量,这使得这种 SEM 技术适用于像生物组织这样对辐射敏感的样品。实验表明该方法的有效性很高,它提高了信号的梯度灵敏度和信噪比。

相似文献

1
3D surface topography imaging in SEM with improved backscattered electron detector: Arrangement and reconstruction algorithm.SEM 中具有改进背散射电子检测器的 3D 表面形貌成像:布置和重建算法。
Ultramicroscopy. 2019 Dec;207:112830. doi: 10.1016/j.ultramic.2019.112830. Epub 2019 Aug 23.
2
Backscattered electron detector for 3D microstructure visualization in scanning electron microscopy.用于扫描电子显微镜中三维微观结构可视化的背散射电子探测器。
Rev Sci Instrum. 2019 Feb;90(2):023701. doi: 10.1063/1.5054746.
3
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images.从四象限背散射电子探测器图像进行 3D 表面重建的正则化技术。
Ultramicroscopy. 2023 Aug;250:113746. doi: 10.1016/j.ultramic.2023.113746. Epub 2023 Apr 28.
4
Cell surface and cell outline imaging in plant tissues using the backscattered electron detector in a variable pressure scanning electron microscope.利用变压扫描电子显微镜中的背散射电子探测器对植物组织的细胞表面和细胞轮廓进行成像。
Plant Methods. 2013 Oct 17;9(1):40. doi: 10.1186/1746-4811-9-40.
5
Backscattered electron imaging for high resolution surface scanning electron microscopy with a new type YAG-detector.采用新型YAG探测器进行高分辨率表面扫描电子显微镜的背散射电子成像。
Scanning Microsc. 1991 Jun;5(2):301-9; discussion 310.
6
The method for the reconstruction of complex images of specimens using backscattered electrons.使用背散射电子重建标本复杂图像的方法。
Scanning. 2002 Mar-Apr;24(2):65-9. doi: 10.1002/sca.4950240203.
7
Fabrication and Characterization of a High-Performance Multi-Annular Backscattered Electron Detector for Desktop SEM.高性能台式扫描电镜多环背散射电子探测器的制作与特性研究。
Sensors (Basel). 2018 Sep 14;18(9):3093. doi: 10.3390/s18093093.
8
Detection of secondary and backscattered electrons for 3D imaging with multi-detector method in VP/ESEM.在可变压力环境扫描电子显微镜(VP/ESEM)中使用多探测器方法进行三维成像时二次电子和背散射电子的检测。
Micron. 2018 Jan;104:45-60. doi: 10.1016/j.micron.2017.10.002. Epub 2017 Oct 19.
9
Simultaneous Scanning Electron Microscope Imaging of Topographical and Chemical Contrast Using In-Lens, In-Column, and Everhart-Thornley Detector Systems.使用透镜内、柱内和埃弗哈特-索恩利探测器系统对形貌和化学对比度进行同步扫描电子显微镜成像。
Microsc Microanal. 2016 Jun;22(3):565-75. doi: 10.1017/S1431927616000751. Epub 2016 May 4.
10
Application of channel electron multipliers in an electron detector for low-voltage scanning electron microscopy.通道电子倍增器在用于低电压扫描电子显微镜的电子探测器中的应用。
J Microsc. 2008 Nov;232(2):369-78. doi: 10.1111/j.1365-2818.2008.02108.x.

引用本文的文献

1
Superalloys fracture process inference based on overlap analysis of 3D models.基于三维模型重叠分析的高温合金断裂过程推断
Commun Eng. 2024 Aug 6;3(1):108. doi: 10.1038/s44172-024-00257-6.
2
Investigation of the Effect of Magnification, Accelerating Voltage, and Working Distance on the 3D Digital Reconstruction Techniques.放大倍数、加速电压和工作距离对三维数字重建技术影响的研究
Scanning. 2020 Sep 28;2020:3743267. doi: 10.1155/2020/3743267. eCollection 2020.