Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China.
University of Chinese Academy of Sciences, Beijing 100049, China.
Sensors (Basel). 2019 Sep 19;19(18):4046. doi: 10.3390/s19184046.
A third-order aberration theory has been developed for the Offner imaging spectrometer comprising an extended source; two concave mirrors; a convex diffraction grating; and an image plane. Analytic formulas of the spot diagram are derived for tracing rays through the system based on Fermat's principle. The proposed theory can be used to discuss in detail individual aberrations of the system such as coma, spherical aberration and astigmatism, and distortion together with the focal conditions. It has been critically evaluated as well in a comparison with exact ray tracing constructed using the commercial software ZEMAX. In regard to the analytic formulas, the results show a high degree of practicality.
已经为包含扩展光源、两个凹面镜、一个凸面衍射光栅和一个像面的 Offner 成像光谱仪开发了三阶像差理论。基于费马原理，推导了用于通过系统追踪光线的光斑图的解析公式。所提出的理论可用于详细讨论系统的个别像差，如彗差、球差和像散以及焦点条件。此外，还通过与使用商业软件 ZEMAX 构建的精确光线追踪进行比较，对其进行了严格评估。就解析公式而言，结果显示出高度的实用性。
