RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.
J Synchrotron Radiat. 2019 Nov 1;26(Pt 6):2050-2054. doi: 10.1107/S1600577519011202. Epub 2019 Sep 23.
A simple method using X-ray fluorescence is proposed to diagnose the duration of an X-ray free-electron laser (XFEL) pulse. This work shows that the degree of intensity correlation of the X-ray fluorescence generated by irradiating an XFEL pulse on metal foil reflects the magnitude relation between the XFEL duration and the coherence time of the fluorescence. Through intensity correlation measurements of copper Kα fluorescence, the duration of 12 keV XFEL pulses from SACLA was evaluated to be ∼10 fs.
提出了一种使用 X 射线荧光的简单方法来诊断 X 射线自由电子激光(XFEL)脉冲的持续时间。这项工作表明,用 XFEL 脉冲辐照金属箔产生的 X 射线荧光的强度相关程度反映了 XFEL 持续时间与荧光相干时间之间的大小关系。通过对铜 Kα 荧光的强度相关测量,评估了来自 SACLA 的 12keV XFEL 脉冲的持续时间约为 10fs。