Gaulandris Fabrizio, Simonsen Søren B, Wagner Jakob B, Mølhave Kristian, Muto Shun, Kuhn Luise T
Department of Energy Conversion and Storage, Technical University of Denmark, Fysikvej, DK-2800 Kgs. Lyngby, Denmak.
DTU Nanolab, Technical University of Denmark, Fysikvej DK-2800 Kgs. Lyngby, Denmark.
Microsc Microanal. 2020 Feb;26(1):3-17. doi: 10.1017/S1431927619015344.
One of the biggest challenges for in situ heating transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) is the ability to measure the local temperature of the specimen accurately. Despite technological improvements in the construction of TEM/STEM heating holders, the problem of being able to measure the real sample temperature is still the subject of considerable discussion. In this study, we review the present literature on methodologies for temperature calibration. We analyze calibration methods that require the use of a thermometric material in addition to the specimen under study, as well as methods that can be performed directly on the specimen of interest without the need for a previous calibration. Finally, an overview of the most important characteristics of all the treated techniques, including temperature ranges and uncertainties, is provided in order to provide an accessory database to consult before an in situ TEM/STEM temperature calibration experiment.
原位加热透射电子显微镜（TEM）和扫描透射电子显微镜（STEM）面临的最大挑战之一是能否准确测量样品的局部温度。尽管TEM/STEM加热支架的构造在技术上有所改进，但能够测量实际样品温度的问题仍然是大量讨论的主题。在本研究中，我们回顾了目前有关温度校准方法的文献。我们分析了除了所研究的样品之外还需要使用测温材料的校准方法，以及无需预先校准即可直接在感兴趣的样品上进行的方法。最后，提供了所有处理技术的最重要特征概述，包括温度范围和不确定度，以便在进行原位TEM/STEM温度校准实验之前提供一个可供参考的辅助数据库。
