Zhang Y, Yan R, Sun T, Ma Y
School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China.
School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China.
Ultramicroscopy. 2020 Apr;211:112941. doi: 10.1016/j.ultramic.2020.112941. Epub 2020 Jan 21.
Tilting crystals to proper zone axes is a necessary but tedious work in taking selected area electron diffraction patterns (SAED) and high-resolution images using transmission electron microscope (TEM). This process not only costs a lot of time but also limits the application of TEM in electron-beam sensitive materials. Therefore, it is desirable to develop a simple method for tilting crystals from random orientations to a specific zone axis quickly. Herein, we describe a novel program, Zones, which can index the electron diffraction pattern and calculate the tilting angles of a double-tilt sample holder from the current orientation to a desired zone axis. It can also bring crystals that are slightly deviated from a zone axis to the exact zone with the help of Laue ring in the diffraction pattern. This program has been successfully applied to studies of zeolites and metal-organic frameworks (MOFs), known as being electron-beam sensitive. The program shows its power not only in saving the operator's time but also in preventing the crystals from quick beam damages.
在使用透射电子显微镜（TEM）获取选区电子衍射图案（SAED）和高分辨率图像时，将晶体倾斜到合适的晶带轴是一项必要但繁琐的工作。这个过程不仅耗费大量时间，还限制了TEM在电子束敏感材料中的应用。因此，需要开发一种简单的方法，将晶体从随机取向快速倾斜到特定的晶带轴。在此，我们描述了一个名为Zones的新程序，它可以对电子衍射图案进行索引，并计算双倾样品台从当前取向到所需晶带轴的倾斜角度。它还可以借助衍射图案中的劳厄环，将稍微偏离晶带轴的晶体带到精确的晶带。该程序已成功应用于对沸石和金属有机框架（MOF）的研究，这些材料已知对电子束敏感。该程序不仅在节省操作人员时间方面显示出其优势，还能防止晶体受到快速的电子束损伤。
