Zhu Yanzhe, Wan Tao, Guan Peiyuan, Wang Yutao, Wu Tom, Han Zhaojun, Tang Genchu, Chu Dewei
School of Materials Science and Engineering, The University of New South Wales, Sydney 2052, Australia.
School of Materials Science and Engineering, The University of New South Wales, Sydney 2052, Australia.
J Colloid Interface Sci. 2020 Apr 15;566:375-382. doi: 10.1016/j.jcis.2020.01.111. Epub 2020 Jan 30.
Silver nanowire (Ag NW)-based flexible and transparent electrodes are a promising candidate for various electronic and optoelectronic applications. However, thermal and electrical instabilities of Ag NW networks during operation and post treatments need to be improved for practical applications. In this work, Ag NW/Graphene Oxide (GO) hybrid films with a multilayer structure were developed, in which transparent GO sheets were inserted between Ag NWs. For the pristine Ag NW networks, contacted NWs exhibited poorer thermal stability than individual NWs as faster Ag diffusion between NWs led to the breakage of the junctions at working temperatures, hence leading to the overall device failure. In contrast, the GO intermediate layers hindered the Ag diffusion between NWs in the Ag NW/Graphene Oxide hybrid films and maintained the junction structure, giving rise to enhanced thermal stability compared to the pristine networks and the GO-covered samples. For electrical tests, unlike the network degradation under annealing treatments, a local deterioration perpendicular to the current flow was directly observed after electrical breakdown, which was attributed to high local temperature under large applied voltage. The electrical failure of the devices was related to the network structure and defects. Furthermore, the pristine devices showed notable variation of failure voltage, which in the hybrid devices is more uniform and improved in general.
基于银纳米线(Ag NW)的柔性透明电极是各种电子和光电子应用的有前途的候选材料。然而,在实际应用中,Ag NW网络在运行和后处理过程中的热稳定性和电稳定性需要得到改善。在这项工作中,开发了具有多层结构的Ag NW/氧化石墨烯(GO)混合薄膜,其中透明的GO片材插入到Ag NW之间。对于原始的Ag NW网络,接触的NWs表现出比单个NWs更差的热稳定性,因为NWs之间更快的Ag扩散导致在工作温度下结的断裂,从而导致整个器件失效。相比之下,GO中间层阻碍了Ag NW/氧化石墨烯混合薄膜中NWs之间的Ag扩散,并维持了结结构,与原始网络和GO覆盖的样品相比,热稳定性得到了增强。对于电学测试,与退火处理下的网络退化不同,在电击穿后直接观察到垂直于电流方向的局部劣化,这归因于大施加电压下的局部高温。器件的电失效与网络结构和缺陷有关。此外,原始器件的失效电压表现出显著变化,而混合器件中的失效电压通常更均匀且有所改善。