Burleigh Robert J, Guo Ang, Smith Natasha, Green Andrew, Thompson Steve, Burt Michael, Brouard Mark
The Chemistry Research Laboratory, Department of Chemistry, University of Oxford, 12 Mansfield Road, Oxford OX1 3TA, United Kingdom.
Ionoptika Limited, Unit B6, Millbrook Close, Chandler's Ford, Eastleigh SO53 4BZ, United Kingdom.
Rev Sci Instrum. 2020 Feb 1;91(2):023306. doi: 10.1063/1.5142271.
A time-of-flight microscope imaging mass spectrometer incorporating a reflectron was used to image mass-resolved ions generated from a 270 μm diameter surface. Mass and spatial resolutions of 8100 ± 700 m/Δm and 18 μm ± 6 μm, respectively, were obtained simultaneously by using pulsed extraction differential acceleration ion optical focusing to create a pseudo-source plane for a single-stage gridless reflectron. The obtainable mass resolution was limited only by the response time of the position-sensitive detector and, according to simulations, could potentially reach 30 200 ± 2900 m/Δm. The spatial resolution can be further improved at the expense of the mass resolution to at least 6 μm by increasing the applied extraction field. An event-triggered fast imaging sensor was additionally used to record ion images for each time-of-flight peak resolved during an experimental cycle, demonstrating the high-throughput capability of the instrument.
一台配备反射器的飞行时间显微镜成像质谱仪用于对从直径为270μm的表面产生的质量分辨离子进行成像。通过使用脉冲提取差分加速离子光学聚焦为单级无栅反射器创建一个伪源平面，同时获得了分别为8100±700 m/Δm和18μm±6μm的质量分辨率和空间分辨率。可获得的质量分辨率仅受位置敏感探测器响应时间的限制，并且根据模拟，可能潜在地达到30200±2900 m/Δm。通过增加施加的提取场，可以以牺牲质量分辨率为代价将空间分辨率进一步提高到至少6μm。此外，还使用了事件触发快速成像传感器来记录在一个实验周期内解析出的每个飞行时间峰的离子图像，证明了该仪器的高通量能力。
