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催化碳纳米洋葱中杂原子掺杂剂的直接成像

Direct imaging of heteroatom dopants in catalytic carbon nano-onions.

作者信息

Thomas Melonie P, Wanninayake Namal, De Alwis Goonatilleke Manisha, Kim Doo Young, Guiton Beth S

机构信息

Department of Chemistry, University of Kentucky, Lexington, Kentucky 40506, USA.

出版信息

Nanoscale. 2020 Mar 12;12(10):6144-6152. doi: 10.1039/d0nr00335b.

Abstract

The hollow core, concentric graphitic shells, and large surface area of the carbon nano-onion (CNO) make these carbon nanostructures promising materials for highly efficient catalytic reactions. Doping CNOs with heteroatoms is an effective method of changing their physical and chemical properties. In these cases, the configurations and locations of the incorporated dopant atoms must be a key factor dictating catalytic activity, yet determining a structural arrangement on the single-atom length scale is challenging. Here we present direct imaging of individual nitrogen and sulfur dopant atoms in CNOs, using an aberration-corrected scanning transmission electron microscopy (STEM) approach, combined with electron energy loss spectroscopy (EELS). Inspection of the statistics of dopant configuration and location in sulfur-, nitrogen-, and co-doped samples reveals dopant atoms to be more closely situated to defects in the graphitic shells for co-doped samples, than in their singly doped counterparts. Correlated with an increased activity for the oxygen reduction reaction in the co-doped samples, this suggests a concerted mechanism involving both the dopant and defect.

摘要

碳纳米洋葱(CNO)的中空核心、同心石墨壳层以及大表面积,使其成为高效催化反应的有前景材料。用杂原子掺杂CNO是改变其物理和化学性质的有效方法。在这些情况下,掺入的掺杂原子的构型和位置必定是决定催化活性的关键因素,然而在单原子长度尺度上确定结构排列具有挑战性。在此,我们使用像差校正扫描透射电子显微镜(STEM)方法并结合电子能量损失谱(EELS),对CNO中的单个氮和硫掺杂原子进行直接成像。对硫掺杂、氮掺杂和共掺杂样品中掺杂剂构型和位置的统计检查表明,与单掺杂样品相比,共掺杂样品中的掺杂原子更靠近石墨壳层中的缺陷。这与共掺杂样品中氧还原反应活性的增加相关,表明存在一种涉及掺杂剂和缺陷的协同机制。

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