Kazim S, Alì M, Palleschi S, D'Olimpio G, Mastrippolito D, Politano A, Gunnella R, Di Cicco A, Renzelli M, Moccia G, Cacioppo O A, Alfonsetti R, Strychalska-Nowak J, Klimczuk T, J Cava R, Ottaviano L
School of Science and Technology Physics division, Università di Camerino, Italy.
Department of Physical and Chemical Sciences (DSFC) Università dell'Aquila, L'Aquila, Italy.
Nanotechnology. 2020 Sep 25;31(39):395706. doi: 10.1088/1361-6528/ab7de6. Epub 2020 Mar 9.
After the recent finding that CrI, displays ferromagnetic order down to its monolayer, extensive studies have followed to pursue new two-dimensional (2D) magnetic materials. In this article, we report on the growth of single crystal CrCl in the layered monoclinic phase. The system after mechanical exfoliation exhibits stability in ambient air (the degradation occurs on a time scale at least four orders of magnitude longer than is observed for CrI). By means of mechanical cleavage and atomic force microscopy (AFM) combined with optical identification, we demonstrate the systematic isolation of single and few layer flakes onto 270 nm and 285 nm SiO/Si (100) substrates with lateral size larger than graphene flakes isolated with the same method. The layer number identification has been carried with statistically significant data, quantifying the optical contrast as a function of the number of layers for up to six layers. Layer dependent optical contrast data have been fitted within the Fresnel equation formalism determining the real and imaginary part of the wavelength dependent refractive index of the material. A layer dependent (532 nm) micro-Raman study has been carried out down to two layers with no detectable spectral shifts as a function of the layer number and with respect to the bulk.
在最近发现 CrI₃ 在其单层状态下仍呈现铁磁有序之后,人们开展了广泛的研究以探寻新型二维(2D)磁性材料。在本文中,我们报道了层状单斜相单晶 CrCl₃ 的生长情况。经过机械剥离后的该体系在环境空气中表现出稳定性(其降解发生的时间尺度比 CrI₃ 所观察到的至少长四个数量级)。借助机械劈裂以及结合光学识别的原子力显微镜(AFM),我们展示了如何将单层和少层薄片系统地分离到 270 nm 和 285 nm SiO₂/Si(100)衬底上,这些薄片的横向尺寸大于用相同方法分离出的石墨烯薄片。层数识别是基于具有统计学意义的数据进行的,对多达六层的层数与光学对比度之间的函数关系进行了量化。层依赖的光学对比度数据在菲涅耳方程形式体系内进行了拟合,从而确定了该材料随波长变化的折射率的实部和虚部。开展了针对少至两层的层依赖(532 nm)显微拉曼研究,未检测到光谱随层数以及相对于体相的变化而发生的偏移。