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一种基于电子束与电流协同作用,用钨针焊接单个一维纳米结构的通用方法。

A Universal Method to Weld Individual One-Dimensional Nanostructures with a Tungsten Needle Based on Synergy of the Electron Beam and Electrical Current.

作者信息

Zhao Peng, Zhang Yu, Tang Shuai, Zhan Runze, She Juncong, Chen Jun, Deng Shaozhi

机构信息

State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, and School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou 510275, China.

出版信息

Nanomaterials (Basel). 2020 Mar 5;10(3):469. doi: 10.3390/nano10030469.

Abstract

One-dimensional (1D) nanostructures are extensively used in the design of novel electronic devices, sensors, and energy devices. One of the major challenges faced by the electronics industry is the problem of contact between the 1D nanostructure and electrode, which can limit or even jeopardize device operations. Herein, a universal method that can realize good Ohmic and mechanical contact between an individual 1D nanostructure and a tungsten needle at sub-micron or micron scale is investigated and presented in a scanning electron microscope (SEM) chamber with the synergy of an electron beam and electrical current flowing through the welded joint. The linear I‒V curves of five types of individual 1D nanostructures, characterized by in-situ electrical measurements, demonstrate that most of them demonstrate good Ohmic contact with the tungsten needle, and the results of in-situ tensile measurements demonstrate that the welded joints possess excellent mechanical performance. By simulation analysis using the finite element method, it is proved that the local heating effect, which is mainly produced by the electrical current flowing through the welded joints during the welding process, is the key factor in achieving good Ohmic contact.

摘要

一维(1D)纳米结构被广泛应用于新型电子器件、传感器和能量器件的设计中。电子工业面临的主要挑战之一是一维纳米结构与电极之间的接触问题,这可能会限制甚至危及器件的运行。在此,研究并提出了一种通用方法,该方法可在扫描电子显微镜(SEM)腔室中,借助电子束和流经焊接接头的电流的协同作用,在亚微米或微米尺度上实现单个一维纳米结构与钨针之间良好的欧姆接触和机械接触。通过原位电学测量表征的五种类型的单个一维纳米结构的线性I‒V曲线表明,它们中的大多数与钨针表现出良好的欧姆接触,原位拉伸测量结果表明焊接接头具有优异的机械性能。通过有限元法进行模拟分析,证明了焊接过程中流经焊接接头的电流产生的局部加热效应是实现良好欧姆接触的关键因素。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3916/7153624/4f95b4d362df/nanomaterials-10-00469-g001.jpg

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