Sun Duo, Feng Bo, Yang Bo, Li Tao, Shao Xiumei, Li Xue, Chen Yifang
Opt Lett. 2020 Mar 15;45(6):1559-1562. doi: 10.1364/OL.376110.
Polarization imaging plays a crucial role in modern photonic applications such as remote sensing, material classification, and reconnaissance. A novel InGaAs focal plane array integrated with linear-array polarization grating is proposed and fabricated to meet the practical needs of near-infrared polarization imaging. In order to accurately evaluate the polarization performance of a fabricated detector, the improved test system is used to measure the transmittance and extinction ratio (ER). The results show that the detectivity reaches ${1}.{06}; \times ;{{10}^{12}};{{\rm cm}\cdot{\rm Hz}^{1/2}}/{\rm W}$1.06×10cm⋅Hz/W, and the operable pixel factor is more than 99.8%. The transmittance of more than 55% and the ER of greater than 21:1 are realized, which indicates that the fabricated detector has excellent capability for near-infrared polarization imaging.
偏振成像在诸如遥感、材料分类和侦察等现代光子应用中起着至关重要的作用。为满足近红外偏振成像的实际需求，提出并制作了一种集成线性阵列偏振光栅的新型铟镓砷焦平面阵列。为准确评估所制作探测器的偏振性能，采用改进的测试系统来测量透过率和消光比（ER）。结果表明，探测率达到(1.06×10^{12}) ({\rm cm}\cdot{\rm Hz}^{1/2}/{\rm W})，可操作像素因子超过99.8%。实现了超过55%的透过率和大于21:1的消光比，这表明所制作的探测器具有出色的近红外偏振成像能力。
