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基于X射线全场显微镜的同步辐射3D-4D纳米成像的最新进展。

Recent progress in synchrotron radiation 3D-4D nano-imaging based on X-ray full-field microscopy.

作者信息

Takeuchi Akihisa, Suzuki Yoshio

机构信息

Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, Sayo, Hyogo 679-5198, Japan.

Graduate School of Frontier Science, University of Tokyo, Kasiwa, Chiba 277-8561, Japan.

出版信息

Microscopy (Oxf). 2020 Oct 30;69(5):259-279. doi: 10.1093/jmicro/dfaa022.

Abstract

The advent of high-flux, high-brilliance synchrotron radiation (SR) has prompted the development of high-resolution X-ray imaging techniques such as full-field microscopy, holography, coherent diffraction imaging and ptychography. These techniques have strong potential to establish non-destructive three- and four-dimensional nano-imaging when combined with computed tomography (CT), called nano-tomography (nano-CT). X-ray nano-CTs based on full-field microscopy are now routinely available and widely used. Here we discuss the current status and some applications of nano-CT using a Fresnel zone plate as an objective. Optical properties of full-field microscopy, such as spatial resolution and off-axis aberration, which determine the effective field of view, are also discussed, especially in relation to 3D tomographic imaging.

摘要

高通量、高亮度同步辐射(SR)的出现推动了高分辨率X射线成像技术的发展,如全场显微镜、全息术、相干衍射成像和叠层成像。当与计算机断层扫描(CT)相结合时,这些技术具有建立无损三维和四维纳米成像的强大潜力,即所谓的纳米断层扫描(nano-CT)。基于全场显微镜的X射线纳米CT现在已常规可用并得到广泛应用。在这里,我们讨论了使用菲涅耳波带片作为物镜的纳米CT的现状和一些应用。还讨论了全场显微镜的光学特性,如空间分辨率和离轴像差,它们决定了有效视场,特别是与三维断层成像相关的特性。

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