Atti Varunsiri, Turagam Mohit K, Garg Jalaj, Koerber Scott, Angirekula Aakash, Gopinathannair Rakesh, Natale Andrea, Lakkireddy Dhanunjaya
Department of Medicine, Michigan State University-Sparrow Hospital, East Lansing, Michigan, USA.
Department of Cardiovascular Diseases, Icahn School of Medicine at Mount Sinai, New York, New York, USA.
JACC Clin Electrophysiol. 2020 Jun;6(6):661-671. doi: 10.1016/j.jacep.2020.01.006. Epub 2020 Mar 16.
This study sought to evaluate the efficacy and safety of venous access techniques for cardiac implantable electronic device (CIED) implantation.
Minimally invasive transvenous access is a fundamental step during implantation of CIEDs. However, the preferred venous access is still subject to ongoing debate, and the decision depends on patient characteristics and operator experience.
A comprehensive search for studies comparing subclavian vein puncture (SVP) and axillary vein puncture (AVP) versus cephalic vein cutdown (CVC) for CIED implantation was performed in PubMed, Google Scholar, EMBASE, SCOPUS, ClinicalTrials.gov, and various scientific conferences from inception to July 1, 2019. A meta-analysis was performed by using a random effects model to calculate risk ratios (RRs) and mean differences with 95% confidence interval (CIs).
Twenty-three studies were eligible that included 35,722 patients (SVP, n = 18,009; AVP, n = 409; and CVC, n = 17,304). Compared with CVC, SVP was associated with a higher risk of pneumothorax (RR: 4.88; 95% CI: 2.95 to 8.06) and device/lead failure (RR: 2.09; 95% CI: 1.07 to 4.09), whereas there was no significant difference in these outcomes compared with AVP. Acute procedural success was significantly higher with SVP compared with CVC (RR: 1.24; 95% CI: 1.00 to 1.53). There was no significant difference in other complications such as pocket hematoma/bleeding, device infection, or pericardial effusion between SVP or AVP compared with CVC.
CVC was associated with a lower risk of pneumothorax and lead failure compared with SVP. AVP and CVC are both effective approaches for CIED lead implantation and offer the potential to avoid the complications usually observed with traditional SVP.
本研究旨在评估心脏植入式电子设备(CIED)植入术中静脉通路技术的有效性和安全性。
微创经静脉通路是CIED植入过程中的一个基本步骤。然而,首选的静脉通路仍存在争议,其决策取决于患者特征和术者经验。
在PubMed、谷歌学术、EMBASE、SCOPUS、ClinicalTrials.gov以及从开始到2019年7月1日的各种科学会议上,全面检索比较锁骨下静脉穿刺(SVP)和腋静脉穿刺(AVP)与头静脉切开术(CVC)用于CIED植入的研究。采用随机效应模型进行荟萃分析,以计算风险比(RRs)和95%置信区间(CIs)的均值差。
23项研究符合条件,共纳入35722例患者(SVP组18009例;AVP组409例;CVC组17304例)。与CVC相比,SVP发生气胸的风险更高(RR:4.88;95%CI:2.95至8.06)以及设备/导线故障的风险更高(RR:2.09;95%CI:1.07至4.09),而与AVP相比,这些结果无显著差异。与CVC相比,SVP的急性手术成功率显著更高(RR:1.24;95%CI:1.00至1.53)。SVP或AVP与CVC相比,在其他并发症如囊袋血肿/出血、设备感染或心包积液方面无显著差异。
与SVP相比,CVC发生气胸和导线故障的风险更低。AVP和CVC都是CIED导线植入的有效方法,并且有可能避免传统SVP常见的并发症。