Morari Vadim, Pantazi Aida, Curmei Nicolai, Postolache Vitalie, Rusu Emil V, Enachescu Marius, Tiginyanu Ion M, Ursaki Veaceslav V
D.Ghitu Institute of Electronic Engineering and Nanotechnologies, Chisinau MD-2028, Republic of Moldova.
Center for Surface Science and NanoTechnology, University Politehnica of Bucharest, 060042-Bucharest, Romania.
Beilstein J Nanotechnol. 2020 Jun 12;11:899-910. doi: 10.3762/bjnano.11.75. eCollection 2020.
A series of Zn Mg O thin films with the composition range = 0.00-0.40 has been prepared by sol-gel spin coating on Si substrates with a post-deposition thermal treatment in the temperature range of 400-650 °C. The morphology of the films was investigated by scanning electron microscopy and atomic force microscopy while their light emission properties were studied by photoluminescence spectroscopy under excitation at 325 nm. It was found that annealing at 500 °C leads to the production of macroscopically homogeneous wurtzite phase films, while thermal treatment at higher or lower temperature results in the degradation of the morphology, or in the formation of ZnO particles embedded into the ZnMgO matrix, respectively. Local compositional fluctuations leading to the formation of deep band tails in the gap were deduced from photoluminescence spectra. A model for the band tail distribution in the bandgap is proposed as a function of the alloy composition. Thin films were also prepared by aerosol spray pyrolysis deposition using the same sol-gel precursors for the purpose of comparison. The prepared films were tested for photodetector applications.
通过溶胶 - 凝胶旋涂法在硅衬底上制备了一系列成分范围为(x = 0.00 - 0.40)的ZnMgO薄膜,并在(400 - 650)°C的温度范围内进行了沉积后热处理。通过扫描电子显微镜和原子力显微镜研究了薄膜的形貌,同时在(325)nm激发下通过光致发光光谱研究了它们的发光特性。发现(500)°C退火导致宏观上均匀的纤锌矿相薄膜的产生,而在更高或更低温度下的热处理分别导致形貌退化或在ZnMgO基体中形成嵌入的ZnO颗粒。从光致发光光谱推断出导致在能隙中形成深能带尾的局部成分波动。提出了一个作为合金成分函数的带隙中带尾分布模型。为了进行比较,还使用相同的溶胶 - 凝胶前驱体通过气溶胶喷雾热解沉积制备了薄膜。对制备的薄膜进行了光电探测器应用测试。