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利用X射线光电子能谱(XPS)对人类指纹进行化学成像

Chemical Imaging of Human Fingermark by X-ray Photoelectron Spectroscopy (XPS).

作者信息

Erdoğan Ayşegül, Esen Meral, Simpson Robin

机构信息

Ege University Application and Research Center for Testing and Analysis (EGE MATAL), İzmir, 35100, Turkey.

Thermo Fisher Scientific, Unit 24 Birches Industrial Estate, East Grinstead, RH191UB, U.K.

出版信息

J Forensic Sci. 2020 Sep;65(5):1730-1735. doi: 10.1111/1556-4029.14483. Epub 2020 Jun 22.

Abstract

X-ray photoelectron spectroscopy (XPS) is a widely used technique to characterize the surface chemistry of materials. It plays a crucial role in accessing qualitative and quantitative information and in detecting the presence of chemical functional groups on the surface of any material. The forensic methods available to detect and identify elements and organic/inorganic compounds are often destructive, so evidence cannot be re-analyzed. However, XPS allows rapid analysis of samples without damaging them. Recently, an increasing number of forensic researchers have begun to study certain chemical information on fingermarks. In this study, the authors aimed to present the applicability and power of XPS imaging in fingermark analysis which can also provide specific information about the fingermark chemical composition. Herein, monochromated X-ray (Al Kα) spot size was fixed at 50 μm. XPS mapping resulted in the acquisition of spectra at each pixel, in an array of 41 × 30 pixels with a step size of 50 μm. Then, a simple discussion has been made about how the scanned surface spectrum and basic snapshot spectra are used to identify different components at a fingertip of a scanned surface area (~3 mm ). Hence, a fingermark pattern contaminated with caffeine, TiO , and Pb/PbO deposited on the silicon wafer can be chemically mapped and visualized by XPS using principal component analysis (PCA). Thus, the present study showed the possible applicability of XPS for the identification of illicit drugs of abuse, gunshot residue, and skin care products on latent fingermark by mimicking a crime scene evidence.

摘要

X射线光电子能谱(XPS)是一种广泛用于表征材料表面化学性质的技术。它在获取定性和定量信息以及检测任何材料表面化学官能团的存在方面起着至关重要的作用。现有的用于检测和识别元素及有机/无机化合物的法医方法通常具有破坏性,因此证据无法重新分析。然而,XPS可以在不损坏样品的情况下对其进行快速分析。最近,越来越多的法医研究人员开始研究指纹上的某些化学信息。在本研究中,作者旨在展示XPS成像在指纹分析中的适用性和效能,其还可以提供有关指纹化学成分的具体信息。在此,单色X射线(Al Kα)光斑尺寸固定为50μm。XPS映射可在41×30像素阵列中以50μm的步长在每个像素处采集光谱。然后,对如何使用扫描表面光谱和基本快照光谱来识别扫描表面区域(约3mm)指尖处的不同成分进行了简要讨论。因此,通过主成分分析(PCA),XPS可以对沉积在硅片上被咖啡因、TiO和Pb/PbO污染的指纹图案进行化学映射和可视化。因此,本研究通过模拟犯罪现场证据,展示了XPS在识别潜在指纹上的滥用非法药物、枪击残留物和护肤品方面的可能适用性。

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