Joung Yeunho, Lee Kyumin, Park Mungi, Choi Wonseok
Department of Electronics and Control Engineering, Hanbat National University, Daejeon 32158, Republic of Korea.
Department of Electrical Engineering, Hanbat National University, Daejeon 32158, Republic of Korea.
J Nanosci Nanotechnol. 2020 Nov 1;20(11):6788-6791. doi: 10.1166/jnn.2020.18784.
In this study, the optical and electrical properties of a transparent conductive oxide (TCO) film synthesized via the radio frequency (RF) magnetron co-sputtering of Al-doped ZnO (AZO) and ZnO targets on a glass substrate were investigated. In the visible region, the resistivity, transmittance, and carrier concentration of the TCO film are influenced by the ratio of Al doping. The samples were prepared using two targets with the same deposition condition, except several different power levels on an AZO target to obtain different Al compositions in the film. The power range was 100-160 W in 20 W steps on the AZO target with a constant 50 W power level on the ZnO target. The electrical and optical characteristics of the film were measured using several apparatuses. The cross-section of the films was measured with via field emission scanning electron microscopy (FESEM) to determine the thickness of the film. The electrical and optical properties of the AZO films were measured via Hall measurement and UV-visible spectroscopy. The structural characteristics of the AZO films were confirmed by Raman spectroscopy.
在本研究中,对通过在玻璃基板上射频(RF)磁控共溅射铝掺杂氧化锌(AZO)靶材和氧化锌靶材合成的透明导电氧化物(TCO)薄膜的光学和电学性质进行了研究。在可见光区域,TCO薄膜的电阻率、透射率和载流子浓度受铝掺杂比例的影响。使用两个靶材在相同的沉积条件下制备样品,只是在AZO靶材上设置了几个不同的功率水平,以在薄膜中获得不同的铝成分。在氧化锌靶材功率水平恒定为50W的情况下,AZO靶材的功率范围为100 - 160W,步长为20W。使用多种仪器测量了薄膜的电学和光学特性。通过场发射扫描电子显微镜(FESEM)测量薄膜的横截面以确定薄膜的厚度。通过霍尔测量和紫外 - 可见光谱法测量了AZO薄膜的电学和光学性质。通过拉曼光谱法确认了AZO薄膜的结构特性。