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电流密度电阻抗断层成像中对数电导率的稀疏重建

Sparse reconstruction of log-conductivity in current density impedance tomography.

作者信息

Gupta Madhu, Mishra Rohit Kumar, Roy Souvik

机构信息

Department of Mathematics, University of Texas at Arlington, 655 W. Mitchell Street, 222H SEIR Building, Arlington, Texas-76010, USA.

Department of Mathematics, University of Texas at Arlington, 655 W. Mitchell Street, 222B SEIR Building, Arlington, Texas-76010, USA.

出版信息

J Math Imaging Vis. 2020 Feb;62:189-205. doi: 10.1007/s10851-019-00929-5. Epub 2019 Nov 19.

Abstract

A new non-linear optimization approach is proposed for the sparse reconstruction of log-conductivities in current density impedance imaging. This framework comprises of minimizing an objective functional involving a least squares fit of the interior electric field data corresponding to two boundary voltage measurements, where the conductivity and the electric potential are related through an elliptic PDE arising in electrical impedance tomography. Further, the objective functional consists of a regularization term that promotes sparsity patterns in the conductivity and a Perona-Malik anisotropic diffusion term that enhances the edges to facilitate high contrast and resolution. This framework is motivated by a similar recent approach to solve an inverse problem in acousto-electric tomography. Several numerical experiments and comparison with an existing method demonstrate the effectiveness of the proposed method for superior image reconstructions of a wide-variety of log-conductivity patterns.

摘要

提出了一种新的非线性优化方法,用于电流密度阻抗成像中对数电导率的稀疏重建。该框架包括最小化一个目标泛函,该泛函涉及与两个边界电压测量对应的内部电场数据的最小二乘拟合,其中电导率和电势通过电阻抗断层成像中出现的椭圆型偏微分方程相关联。此外,目标泛函由一个促进电导率稀疏模式的正则化项和一个增强边缘以促进高对比度和分辨率的佩罗纳 - 马利克各向异性扩散项组成。该框架的灵感来自于最近一种类似的方法,用于解决声电断层成像中的逆问题。几个数值实验以及与现有方法的比较证明了所提出方法在重建各种对数电导率模式方面的有效性。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7741/7347294/beb03feb6379/nihms-1544096-f0004.jpg

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