Denier van der Gon D, Timmerman D, Matsude Y, Ichikawa S, Ashida M, Schall P, Fujiwara Y
Opt Lett. 2020 Jul 15;45(14):3973-3976. doi: 10.1364/OL.397848.
GaN-based micro-LEDs typically suffer from a size-dependent efficiency due to the relatively long carrier lifetime and sidewall-related recombination effects. We demonstrate that for red-emitting Eu-doped GaN, sidewall-related recombination is hardly an issue for emission efficiency. We determine the photoluminescence quantum efficiency (PL QE) of Eu-related emission as a function of the size of square structures ranging from 3 to 192 µm. With the support of finite-difference time-domain simulations, we show that the light extraction efficiency and material losses are responsible for the decrease in PL QE for large sizes. For sizes smaller than 24 µm, there is an influence of the sidewall-related non-radiative recombination of carriers on the PL QE; however, it is only minor as a result of the limited carrier diffusion lengths in the Eu-doped material. These properties combined with the high efficiency of luminescence indicate the potential of this material for micro-LED applications.
由于载流子寿命相对较长以及与侧壁相关的复合效应,基于氮化镓(GaN)的微型发光二极管(micro-LED)通常存在效率依赖于尺寸的问题。我们证明,对于发红光的铕(Eu)掺杂氮化镓,与侧壁相关的复合对发光效率几乎没有影响。我们测定了铕相关发射的光致发光量子效率(PL QE)作为边长从3到192 µm的方形结构尺寸的函数。在时域有限差分模拟的支持下,我们表明,对于较大尺寸,光提取效率和材料损耗是导致PL QE下降的原因。对于尺寸小于24 µm的情况,载流子与侧壁相关的非辐射复合对PL QE有影响;然而,由于铕掺杂材料中载流子扩散长度有限,这种影响较小。这些特性与高发光效率相结合,表明这种材料在微型发光二极管应用方面具有潜力。