Akashi Tetsuya, Takahashi Yoshio, Harada Ken
Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama 350-0395, Japan.
CEMS, RIKEN (The Institute of Physical and Chemical Research), Hatoyama, Saitama 350-0395, Japan.
Microscopy (Oxf). 2020 Dec 3;69(6):411-416. doi: 10.1093/jmicro/dfaa040.
We have developed an amplitude-division type Mach-Zehnder electron interferometer (MZ-EI). The developed MZ-EI is composed of single crystals corresponding to amplitude-division beam splitters, lenses corresponding to mirrors and an objective aperture. The spacings and azimuth angles of interference fringes can be controlled by single crystal materials and their orientations and by diffraction spots selected by the objective aperture. We built the MZ-EI on a 1.2-MV field-emission transmission electron microscope and tested its performance. Results showed that interference fringes were created for various spacings and azimuth angles, which demonstrates the practicability of the MZ-EI as an amplitude-division type electron interferometer.
我们研制了一种分振幅型马赫-曾德尔电子干涉仪（MZ-EI）。所研制的MZ-EI由对应于分振幅分束器的单晶、对应于反射镜的透镜和物镜光阑组成。干涉条纹的间距和方位角可以通过单晶材料及其取向以及物镜光阑选择的衍射斑来控制。我们将MZ-EI搭建在一台1.2兆伏场发射透射电子显微镜上并测试了其性能。结果表明，产生了具有各种间距和方位角的干涉条纹，这证明了MZ-EI作为分振幅型电子干涉仪的实用性。
