Zolotov Denis, Buzmakov Alexey, Grigoriev Maxim, Schelokov Igor
Shubnikov Institute of Crystallography, Federal Scientific Research Centre 'Crystallography and Photonics' RAS, Leninsky prospekt 59, Moscow, 119333, Russian Federation.
Institute of Microelectronics Technology and High Purity Materials RAS, Ak. Osip'yan Street 6, Chernogolovka, Moscow Region, 142432, Russian Federation.
J Appl Crystallogr. 2020 May 27;53(Pt 3):781-788. doi: 10.1107/S1600576720005439. eCollection 2020 Jun 1.
In the present work, a method for adjusting a crystal analyzer to separate two characteristic lines from the spectrum of a conventional X-ray tube for simultaneous registration of tomographic projections is proposed. The experimental implementation of this method using radiation of a molybdenum anode (α, β lines) and a silicon Si(111) crystal analyzer in Laue geometry is presented. Projection images at different wavelengths are separated in space and can be recorded independently for further processing. Potential uses of this scheme are briefly discussed.
在本工作中,提出了一种调整晶体分析仪的方法,用于从传统X射线管的光谱中分离出两条特征线,以便同时记录层析投影。介绍了使用钼阳极(α、β线)的辐射和处于劳厄几何构型的硅Si(111)晶体分析仪对该方法进行的实验实施。不同波长下的投影图像在空间上被分离,并且可以独立记录以进行进一步处理。简要讨论了该方案的潜在用途。