Huang Vincent W, Liu Yafei, Raghothamachar Balaji, Dudley Michael
Department of Materials Science and Chemical Engineering, Stony Brook University, Stony Brook, New York 11790, USA.
J Appl Crystallogr. 2023 Sep 27;56(Pt 5):1610-1615. doi: 10.1107/S1600576723007926. eCollection 2023 Oct 1.
The program is a popular and easy-to-use crystallography tool for indexing and simulating X-ray Laue patterns, but its previous versions lack search functions for recognizing Laue patterns taken from crystals with unknown orientations. To overcome this obstacle, a major upgrade of the program, called , is presented with three robust search schemes implemented: (i) crystal rotation along a single diffraction vector, (ii) a look-up method to search for reflection pairs matching the interplanar angle of two selected diffraction spots, and (iii) a more efficient look-up scheme to search for reflection triplets matching three interplanar angles. Extensive tests show that all these schemes, together with the convenient graphical user interfaces and highly optimized computing algorithms, are reliable and powerful for recognizing and fitting Laue patterns of any crystal taken under any diffraction geometry.