Lai Teh, Potter B G, Simmons-Potter Kelly
Appl Opt. 2020 Aug 1;59(22):G225-G233. doi: 10.1364/AO.391957.
Electroluminescence (EL) imaging of Si-based photovoltaic (PV) modules is used widely to spatially detect and characterize electrical defects, including handling and degradation-induced cracking of the component Si cells that are associated with reductions in module performance. In the present study, a commercial polycrystalline silicon PV module was subjected to accelerated lifecycle test environmental conditions and examined as a function of environmental exposure time using EL imaging. The approach followed pixel intensity distributions over each individual PV cell and confirmed a positive correlation between module conversion efficiency and results of the image analysis. Overall, an average of a 2.5% reduction in normalized EL intensity was correlated to a 0.35% reduction in actual power conversion efficiency (or a 2.3% decrease in relative efficiency). The imaging analysis technique offers a rapid, unsupervised means to assess EL data in lieu of conventional visual interpretation.
基于硅的光伏（PV）组件的电致发光（EL）成像被广泛用于在空间上检测和表征电气缺陷，包括与组件性能下降相关的硅电池在处理和降解过程中产生的开裂。在本研究中，一个商用多晶硅光伏组件被置于加速生命周期测试环境条件下，并使用EL成像作为环境暴露时间的函数进行检测。该方法跟踪了每个光伏电池上的像素强度分布，并证实了组件转换效率与图像分析结果之间存在正相关。总体而言，归一化EL强度平均降低2.5%与实际功率转换效率降低0.35%（或相对效率降低2.3%）相关。成像分析技术提供了一种快速、无监督的方法来评估EL数据，以代替传统的目视解释。
