Wang Hongjie, Jin Jinjiang, Chu Yonghua
The Second Affiliated Hospital of Zhejiang University School of Medicine, Hangzhou, 310009.
Zhongguo Yi Liao Qi Xie Za Zhi. 2020 Apr 8;44(4):367-370. doi: 10.3969/j.issn.1671-7104.2020.04.019.
The modifications of slices, flip angle, SAR mode and TR time are required when the SAR exceeds the limits. The scan time and image quality are affected by those. This study analyzes the SAR from the basic side. With the principle diagram of SIEMENS 1.5 T AVANTO and 3.0 T VERIO MRIS, the trouble shooting procedure of SAR problem is reached both in application and problem sides.
当比吸收率(SAR)超过限制时,需要对切片、翻转角、SAR模式和重复时间(TR)进行调整。这些会影响扫描时间和图像质量。本研究从基础层面分析了SAR。借助西门子1.5T Avanto和3.0T Verio磁共振成像系统(MRI)的原理图,从应用和问题两个方面得出了SAR问题的故障排除程序。