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晶体学平面米勒指数的识别:基础理论教程及基于不同案例研究的通用方法与注意事项的全面综述

Identification of the Miller indices of a crystallographic plane: a tutorial and a comprehensive review on fundamental theory, universal methods based on different case studies and matters needing attention.

作者信息

Sun Shaodong, Zhang Xiaochuan, Cui Jie, Liang Shuhua

机构信息

Engineering Research Center of Conducting Materials and Composite Technology, Ministry of Education; Shaanxi Engineering Research Center of Metal-Based Heterogeneous Materials and Advanced Manufacturing Technology; Shaanxi Province Key Laboratory for Electrical Materials and Infiltration Technology; School of Materials Science and Engineering, Xi'an University of Technology, Xi'an 710048, Shaanxi, People's Republic of China.

出版信息

Nanoscale. 2020 Aug 20;12(32):16657-16677. doi: 10.1039/d0nr03637d.

Abstract

Micro-/nanostructures exposed with special crystallographic planes (surface or crystal facets) exhibit distinctive physicochemical properties because of their unique atomic arrangements, resulting in their widespread applications in the fields of catalysis, energy conversion, sensors, electrical devices and so on. Therefore, tremendous progress has been made in facet-dependent investigation of various micro-/nanocrystals over the past decades. However, a lot of beginners including undergraduate students as well as graduate students lack systematic knowledge and don't know how to identify the Miller indices of a crystallographic plane in the actual research process. So far, to the best of our knowledge, there is no specialized review article in this respect. Herein, we present a tutorial and a comprehensive review on the identification of the Miller indices of a crystallographic plane, including fundamental theory, universal methods based on different case studies, and matters needing attention. Hopefully, this tutorial review will be a beneficial theoretical and practical reference for beginners currently focusing on the controllable preparation and facet-dependent investigation of micro-/nanocrystals.

摘要

暴露有特殊晶面(表面或晶面)的微/纳米结构由于其独特的原子排列而表现出独特的物理化学性质,从而在催化、能量转换、传感器、电子器件等领域得到广泛应用。因此,在过去几十年里,对各种微/纳米晶体的晶面依赖性研究取得了巨大进展。然而,许多初学者,包括本科生和研究生,缺乏系统的知识,并且在实际研究过程中不知道如何识别晶面的密勒指数。据我们所知,到目前为止,在这方面还没有专门的综述文章。在此,我们给出了一篇关于晶面密勒指数识别的教程和全面综述,包括基本理论、基于不同案例研究的通用方法以及注意事项。希望这篇教程综述能为目前专注于微/纳米晶体可控制备和晶面依赖性研究的初学者提供有益的理论和实践参考。

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