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小儿患者使用持久型心室辅助装置后的儿科心脏重症监护病房的出院和再入院。

Discharge and Readmission to the Pediatric Cardiac ICU in Pediatric Patients With Durable Ventricular Assist Devices.

机构信息

Faculty of Medicine and Dentistry, University of Alberta, Edmonton, AB, Canada.

Department of Pediatric Cardiology, University of Alberta, Edmonton, AB, Canada.

出版信息

Pediatr Crit Care Med. 2020 Sep;21(9):e810-e818. doi: 10.1097/PCC.0000000000002456.

Abstract

OBJECTIVES

Pediatric patients implanted with a durable ventricular assist device are initially managed in the pediatric cardiac ICU but are eligible for discharge to the ward. Our objectives were to characterize discharge and readmission of ventricular assist device patients to the pediatric cardiac ICU, identify risk factors for readmission, and determine whether discharge or readmission is associated with mortality.

DESIGN

Retrospective study.

SETTING

Stollery Children's Hospital.

PATIENTS

Patients implanted with a durable ventricular assist device at less than 18 years old between 2005 and 2016.

INTERVENTIONS

None.

MEASUREMENTS AND MAIN RESULTS

There were 44 patients who underwent ventricular assist device implantation at a median age of 3.7 years (interquartile range, 0.6-9.0 yr), with the most common etiology being noncongenital heart disease (76.7%). Median time of total ventricular assist device support was 110.0 days (interquartile range, 42.3-212.3 d) with the median index pediatric cardiac ICU stay being 34.0 days (interquartile range, 19.8-81.0 d). Thirty patients (68.0%) were discharged to the ward with 18 (60.0%) having at least one readmission. The median time to first readmission was 18.0 days (interquartile range, 14.8-109.8 d) with a median of two readmissions per patient (interquartile range, 1.0-3.0). The most common reason for readmission was pump thrombosis (30.4%), followed by neurologic dysfunction (23.9%). There were no statistically significant pre- or post-implant factors associated with readmission, and readmission was not associated with mortality (p = 0.600). Univariate Kaplan-Meier survival analysis indicated that use of pre-implant extracorporeal membrane oxygenation, post-implant continuous renal replacement therapy, as well as failure to be discharged from the index pediatric cardiac ICU stay were associated with mortality.

CONCLUSIONS

Readmissions to the pediatric cardiac ICU occurred in 60.0% of pediatric patients on durable ventricular assist devices with the first readmission occurring within a month of discharge from the index pediatric cardiac ICU stay. While readmission was not associated with mortality, lack of discharge from index pediatric cardiac ICU stay was likely due to a worse pre-implant clinical status.

摘要

目的

植入耐用型心室辅助装置的儿科患者最初在儿科心脏 ICU 接受治疗,但有资格出院至病房。我们的目的是描述心室辅助装置患者出院和重新入院儿科心脏 ICU 的情况,确定重新入院的危险因素,并确定出院或重新入院是否与死亡率相关。

设计

回顾性研究。

地点

斯特罗利儿童医院。

患者

2005 年至 2016 年间,18 岁以下植入耐用型心室辅助装置的患者。

干预措施

无。

测量和主要结果

共有 44 名患者在中位年龄 3.7 岁(四分位间距,0.6-9.0 岁)时接受心室辅助装置植入,最常见的病因是非先天性心脏病(76.7%)。中位总心室辅助装置支持时间为 110.0 天(四分位间距,42.3-212.3 d),中位索引儿科心脏 ICU 住院时间为 34.0 天(四分位间距,19.8-81.0 d)。30 名患者(68.0%)出院至病房,其中 18 名(60.0%)至少有一次重新入院。首次重新入院的中位时间为 18.0 天(四分位间距,14.8-109.8 d),每位患者的中位重新入院次数为 2 次(四分位间距,1.0-3.0)。重新入院的最常见原因是泵血栓形成(30.4%),其次是神经功能障碍(23.9%)。植入前或植入后没有统计学意义的因素与重新入院相关,重新入院与死亡率无关(p = 0.600)。单变量 Kaplan-Meier 生存分析表明,植入前使用体外膜氧合、植入后使用连续肾脏替代治疗以及未能从索引儿科心脏 ICU 住院期间出院与死亡率相关。

结论

耐用型心室辅助装置儿科患者中有 60.0%重新入院儿科心脏 ICU,首次重新入院发生在从索引儿科心脏 ICU 住院期间出院后一个月内。虽然重新入院与死亡率无关,但未能从索引儿科心脏 ICU 住院期间出院可能是由于植入前临床状况较差。

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