Institute of Agricultural Biotechnology, Jilin Academy of Agricultural Sciences, Changchun 130033, China.
Maize Research Institute, Jilin Academy of Agricultural Sciences, Gongzhuling 136100, China.
Plant Dis. 2021 Mar;105(3):558-565. doi: 10.1094/PDIS-02-20-0411-RE. Epub 2021 Mar 4.
Ear rot is a globally prevalent class of disease in maize, of which Fusarium ear rot (FER), caused by the fungal pathogen , is the most commonly reported. In this study, three F populations, namely F-C, F-D, and F-J, and their corresponding F families were produced by crossing three highly FER-resistant inbred lines, Cheng351, Dan598, and JiV203, with the same susceptible line, ZW18, for quantitative trait locus (QTL) mapping of FER resistance. The individual crop plants were inoculated with a spore suspension of the pathogen injected into the kernels of the maize ears. The broad-sense heritability () for FER resistance was estimated to be as high as 0.76, 0.81, and 0.78 in F-C, F-D, and F-J, respectively, indicating that genetic factors played a key role in the phenotypic variation. We detected a total of 20 FER-resistant QTLs in the three F populations, among which QTLs derived from the resistant parent Cheng351, Dan598, and JiV203 explained 62.89 to 82.25%, 43.19 to 61.51%, and 54.70 to 75.77% of the phenotypic variation, respectively. Among all FER-resistant QTLs detected, , , and accounted for the phenotypic variation as high as 26.58 to 43.36%, 11.76 to 18.02%, and 12.02 to 21.81%, respectively. Furthermore, QTLs mapped in different F populations showed some extent of overlaps indicating potential resistance hotspots. The FER-resistant QTLs detected in this study can be explored as useful candidates to improve FER resistance in maize by introducing these QTLs into susceptible maize inbred lines via molecular marker-assisted selection.
穗腐病是一种普遍存在于玉米中的全球性疾病，其中由真菌病原体引起的镰刀菌穗腐病（FER）是最常见的报道。在这项研究中，通过将三个高度抗 FER 的自交系，即 Cheng351、Dan598 和 JiV203，与相同的易感系 ZW18 杂交，产生了三个 F 群体，即 F-C、F-D 和 F-J，以及它们各自的 F 家族，用于 FER 抗性的数量性状位点（QTL）作图。每个作物植株都用病原菌孢子悬浮液接种到玉米穗的穗粒中。FER 抗性的广义遗传力（）估计在 F-C、F-D 和 F-J 中分别高达 0.76、0.81 和 0.78，表明遗传因素在表型变异中起着关键作用。我们在三个 F 群体中总共检测到 20 个 FER 抗性 QTL，其中来自抗性亲本 Cheng351、Dan598 和 JiV203 的 QTL 分别解释了 62.89%到 82.25%、43.19%到 61.51%和 54.70%到 75.77%的表型变异。在所检测到的所有 FER 抗性 QTL 中， 、 和 解释了高达 26.58%到 43.36%、11.76%到 18.02%和 12.02%到 21.81%的表型变异。此外，在不同 F 群体中定位的 QTL 具有一定程度的重叠，表明存在潜在的抗性热点。本研究中检测到的 FER 抗性 QTL 可作为有用的候选基因，通过分子标记辅助选择将这些 QTL 引入易感玉米自交系中，从而提高玉米的 FER 抗性。
