Wu Yinghui, Wang Dong, Liu Jinyuan, Cai Houzhi, Zhang Yueqiang
Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China.
Nanomaterials (Basel). 2020 Sep 12;10(9):1819. doi: 10.3390/nano10091819.
Scanning Kelvin probe microscopy (SKPM), electrostatic force microscopy (EFM) are used to study the microscopic processes of the photo-induced charge separation at the interface of Ag and conductive polymers, i.e., poly[2,6-(4,4-bis-(2-ethylhexyl)-4-cyclopenta[2,1-b;3,4-b']dithiophene)-alt-4,7-(2,1,3-benzothiadiazole)] (PCPDTBT) and poly(3-hexylthiophene-2,5-diyl) (P3HT). They are also widely used in order to directly observe the charge distribution and dynamic changes at the interfaces in nanostructures, owing to their high sensitivity. Using SKPM, it is proved that the charge of the photo-induced polymer PCPDTBT is transferred to Ag nanoparticles (NPs). The surface charge of the Ag-induced NPs is quantified while using EFM, and it is determined that the charge is injected into the polymer P3HT from the Ag NPs. We expect that this technology will provide guidance to facilitate the separation and transfer of the interfacial charges in the composite material systems and it will be applicable to various photovoltaic material systems.
扫描开尔文探针显微镜（SKPM）、静电力显微镜（EFM）被用于研究银与导电聚合物界面处光致电荷分离的微观过程，即聚[2,6-(4,4-双-(2-乙基己基)-4-环戊并[2,1-b;3,4-b']二噻吩)-交替-4,7-(2,1,3-苯并噻二唑)]（PCPDTBT）和聚(3-己基噻吩-2,5-二亚基)（P3HT）。由于它们具有高灵敏度，还被广泛用于直接观察纳米结构界面处的电荷分布和动态变化。使用SKPM证明了光致聚合物PCPDTBT的电荷转移到了银纳米颗粒（NPs）上。在使用EFM时对银诱导的NPs的表面电荷进行了量化，并确定电荷从银纳米颗粒注入到了聚合物P3HT中。我们期望这项技术将为促进复合材料系统中界面电荷的分离和转移提供指导，并且它将适用于各种光伏材料系统。
