Hondo Toshinobu, Kobayashi Hiroshi, Toyoda Michisato
MS-Cheminformatics LLC, Toin, Inabe-gun, Mie, Japan.
Project Research Center for Fundamental Sciences, Graduate School of Science, Osaka University, Toyonaka, Osaka, Japan.
Mass Spectrom (Tokyo). 2020;9(1):A0088. doi: 10.5702/massspectrometry.A0088. Epub 2020 Aug 20.
Using a multi-turn time-of-flight (TOF) mass spectrometer, we have extracted a single xenon isotope ion, Xe, from its orbit at given a lap number without disturbing the rest of isotopes. After detecting the Xe at 20 laps, the rest of the xenon isotope spectrum was obtained at 30 laps, which generated a TOF spectrum where the TOF difference between Xe and Xe was 87.4 μs while Xe and Xe were 1.03 μs. The time distance between Xe and other isotopes can be set by any lap difference that is a factor of 8.7 μs, which depends on the acceleration voltage and the mass of the ion. Method accuracy was verified by comparing the isotopic abundance ratio of the xenon sample after withdrawing one of the ions from the isotope cluster to the abundance ratio obtained from the conventional method. The TOF stability was also evaluated at various lap numbers between 10 to 230.
使用多圈飞行时间（TOF）质谱仪，我们在给定圈数时从其轨道中提取了单个氙同位素离子Xe，而不干扰其他同位素。在20圈时检测到Xe后，在30圈时获得了其余氙同位素光谱，这产生了一个TOF光谱，其中Xe和Xe之间的TOF差值为87.4 μs，而Xe和Xe之间为1.03 μs。Xe与其他同位素之间的时间距离可以通过任何8.7 μs倍数的圈数差来设置，这取决于加速电压和离子质量。通过比较从同位素簇中提取一个离子后的氙样品的同位素丰度比与传统方法获得的丰度比，验证了方法的准确性。还在10至230的不同圈数下评估了TOF稳定性。
